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Anomalous Dispersion Corrections to Surface and Interface Exafs Measurements Made Using Glancing Angles

Published online by Cambridge University Press:  26 February 2011

Huaiyu Chen ,
Steve M. Heald  and
John M. Tranquada
Huaiyu Chen
Affiliation:
Metallurgy and Materials Science Division, Brookhaven National Laboratory, Upton, NY 11973
Steve M. Heald
Affiliation:
Metallurgy and Materials Science Division, Brookhaven National Laboratory, Upton, NY 11973
John M. Tranquada
Affiliation:
Metallurgy and Materials Science Division, Brookhaven National Laboratory, Upton, NY 11973
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Abstract

EXAFS studies using glancing angle fluorescence on the interface of the Cu-Al thin film system show that the sputtering process generates a different interface structure than for an evaporated one. To obtain quantitative information, the anomalous dispersion effects have to be considered. Simple model calculations are presented for the correction factor which yield good results for Au thin film data. Extension of this model to bilayer systems is discussed.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 77: Symposium D – Interfaces, Superlattices, and Thin Films , 1986 , 169
Copyright
Copyright © Materials Research Society 1987

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References

REFERENCES

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