Hostname: page-component-848d4c4894-pjpqr Total loading time: 0 Render date: 2024-06-20T21:13:18.373Z Has data issue: false hasContentIssue false
  • English
  • Français

3-D Measurement of Deformation Microstructure in Al(0.2%)Mg Using Submicron Resolution White x-ray Microbeams

Published online by Cambridge University Press:  10 February 2011

B.C. Larson ,
N. Tamura ,
J.-S. Chung ,
G.E. Ice ,
J. D. Budai ,
J. Z. Tischler ,
W. Yang ,
H. Weiland  and
W.P. Lowe
B.C. Larson
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830
N. Tamura
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830
J.-S. Chung
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830
G.E. Ice
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830
J. D. Budai
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830
J. Z. Tischler
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830
W. Yang
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830
H. Weiland
Affiliation:
Alcoa Technical Center, Alcoa Center, PA
W.P. Lowe
Affiliation:
Howard University, Washington D.C.
Get access

Abstract

We have used submicron-resolution white x-ray microbeanis on the MHATT-CAT beamline 7-ID at the Advanced Photon Source to develop techniques for three-dimensional investigation of the deformation microstructure in a 20% plane strain compressed Al(0.2%)Mg tri-crystal. Kirkpatrick-Baez mirrors were used to focus white radiation from an undulator to a 0.7 × 0.7 μm2 beam that was scanned over bi- and tri-crystal regions near the triple-junction of the tricrystal. Depth resolution along the x-ray microbeam of less than 5 microns was achieved by triangulation to the diffraction source point using images taken at a series of CCD distances from the microbeam. Computer indexing of the deformation cell structure in the bi-crystal region provided orientations of individual subgrains to ∼0.01°, making possible detailed measurements of the rotation axes between individual cells.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 590: Symposium R – Applications of Synchrotron Radiation Techniques…V , 1999 , 247
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Hähner, P. and Zaiser, M., Acta Mater. 45, 1067 (1997).10.1016/S1359-6454(96)00227-3Google Scholar
2. Hansen, N. and Hughes, D. A., Phys. Stat. Sol. (b) 149, 155 (1995).10.1002/pssa.2211490111Google Scholar
3. Chung, J.-S. and Ice, G.E., J. Appl. Phys., 86, 5249 (1999).10.1063/1.371507Google Scholar
4. Chung, J.-S., Tamura, N., Ice, G. E., Larson, B. C., Budai, J. D., and Lowe, W., Mat. Res. Soc. Proc. 563, 169 (1999).10.1557/PROC-563-169Google Scholar
5. Tamura, N., Chung, J.-S., Ice, G. E., Larson, B. C., Budai, J. D., Tischler, J. Z., Yoon, M., Williams, E. L., and Lowe, W., Mat. Res. Soc. Proc. 563, 175 (1999).10.1557/PROC-563-175Google Scholar
6. Ice, G. E., Chung, J.-S., Lowe, W., Williams, E. L., and Edelman, J., Rev. Sci. Inst. (submitted).Google Scholar
7. Weiland, H. and Becker, R., in Proceeding 20th Riso Intern. Symp. on Mat. Sci.: Deformation-induced Microstructures: Analysis and Relation to Properties, edited by Leffer, T. and Pederson, O.P., Riso Intern. Laboratory, Roskilde, Denmark 1999, p. 213.Google Scholar
8. Piotrowski, D.P., Stock, S.R., Guvenilir, A., Haase, J.D., and Rek, Z.U., Mat. Res. Soc. Symp. 437, 125 (1996).10.1557/PROC-437-125Google Scholar