Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-12-07T16:06:51.008Z Has data issue: false hasContentIssue false
  • English
  • Français

Single atom imaging and spectroscopy in nanostructured carbon materials

Published online by Cambridge University Press:  13 January 2012

Kazu Suenaga ,
Haruka Kobayashi  and
Masanori Koshino
Kazu Suenaga
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Central 5, Tsukuba, 305-8565, Japan; suenaga-kazu@aist.go.jp
Haruka Kobayashi
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Central 5, Tsukuba, 305-8565, Japan; haruka-kobayashi@aist.go.jp
Masanori Koshino
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Central 5, Tsukuba, 305-8565, Japan; m-koshino@aist.go.jp
Get access

Abstract

Identifying constituent atoms in materials is the ultimate goal for all analytical techniques. Here, we describe the successful achievement of single atom spectroscopy in nanostructured carbon-based materials using a scanning transmission electron microscope equipped with electron energy-loss spectroscopy. The chemical analyis of individual metallofullerene molecules can be successfully performed without massive beam damage. Atom-by-atom spectroscopy of the edge carbon atoms in single layer graphene is also discussed.

Keywords

Nanoscaleelectron energy-loss spectroscopy (EELS)scanning transmission electron microscopy (STEM)defects
Type
Research Article
Information
MRS Bulletin , Volume 37 , Issue 1: Spectroscopic imaging in electron microscopy , January 2012 , pp. 36 - 38
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Suenaga, K., Tencé, M., Mory, C., Colliex, C., Kato, H., Okazaki, T., Shinohara, H., Hirahara, K., Bandow, S., Iijima, S., Science 290, 2280 (2000).CrossRefGoogle Scholar
2.Hirahara, K., Suenaga, K., Bandow, S., Okazaki, T., Kato, H., Shinohara, H., Iijima, S., Phys. Rev. Lett. 85, 5384 (2000).CrossRefGoogle Scholar
3.Tencé, M., Quartuccio, M., Colliex, C., Ultramicroscopy 58, 42 (1995).CrossRefGoogle Scholar
4.Sawada, H., Sasaki, T., Hosokawa, F., Yuasa, S., Terao, M., Kawazoe, M., Nakamichi, T., Kaneyama, T., Kondo, Y., Kimoto, K., Suenaga, K., J. Electron Microscopy 58, 341 (2009).CrossRefGoogle Scholar
5.Sawada, H., Sasaki, T., Hosokawa, F., Yuasa, S., Terao, M., Kawazoe, M., Nakamichi, T., Kaneyama, T., Kondo, Y., Kimoto, K., Suenaga, K., Ultramicroscopy 110, 958 (2010).CrossRefGoogle Scholar
6.Sasaki, T., Sawada, H., Hosokawa, F., Kohno, Y., Tomita, T., Kaneyama, T., Kondo, Y., Kimoto, K., Sato, Y., Suenaga, K., J. Electron Microscopy 59, S7 (2010).CrossRefGoogle Scholar
7.Suenaga, K., Sato, Y., Liu, Z., Kataura, H., Okazaki, T., Kimoto, K., Sawada, H., Sasaki, T., Omoto, K., Tomita, T., Kaneyama, T., Kondo, Y., Nature Chem. 1, 415 (2010).CrossRefGoogle Scholar
8.Krivanek, O., Dellby, N., Murfitt, M.F., Chisholm, M.F., Pennycook, T.J., Suenaga, K., Nicolosi, V., Ultramicroscopy 110, 935 (2010).CrossRefGoogle Scholar
9.Banhart, F., Reports on Progress in Physics 62, 1181 (1999).CrossRefGoogle Scholar
10.Gubbens, A., Barfels, M., Trevor, C., Twesten, R., Mooney, P., Thomas, P., Menon, N., Kraus, B., Mao, C., McGinn, B., Ultramicroscopy 110, 962 (2010).CrossRefGoogle Scholar
11.Suenaga, K., Iizumi, Y., Okazaki, T., European Physical Journal Applied Physics 54, 33508 (2011).CrossRefGoogle Scholar
12.Girit, C.O., Meyer, J.C., Erni, R., Rossell, M.D., Kisielowski, C., Yang, L., Park, C-H., Crommie, M.F., Cohen, M.L., Louie, S.G., Zettl, A., Science 323, 1705 (2009).CrossRefGoogle Scholar
13.Kobayashi, Y., Fukui, K., Enoki, T., Kusakabe, K., Phys. Rev. B 73, 125415 (2006).CrossRefGoogle Scholar
14.Suenaga, K., Koshino, M., Nature 468 1088 (2010).CrossRefGoogle Scholar