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Synergy of Resonant Oscillatory Modes in Atomic Force Microscopy of Polymers

  • Sergei Magonov (a1), Sergey Belikov (a1), John Alexander (a1) and Marko Surtchev (a1)

Abstract

The set of oscillatory resonance AFM modes is expanded with frequency modulation mode and frequency imaging in amplitude modulation mode. The backgrounds of these modes are discussed and their capabilities are compared on the practical examples. The data show how these techniques complement the amplitude modulation with phase imaging. The frequency imaging enhances the compositional mapping of heterogeneous samples. Frequency modulation mode provides a superior capability in imaging at low tip-sample forces.

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*(Email: magonov@ntmdt.us)

References

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Keywords

Synergy of Resonant Oscillatory Modes in Atomic Force Microscopy of Polymers

  • Sergei Magonov (a1), Sergey Belikov (a1), John Alexander (a1) and Marko Surtchev (a1)

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