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SHI induced evolution of surface and wettability of BaF2 thin films

Published online by Cambridge University Press:  08 April 2019

Ratnesh K Pandey ,
Tanuj Kumar Open the ORCID record for Tanuj Kumar [Opens in a new window] ,
Udai B Singh ,
Shikha Awasthi  and
Avinash C Pandey
Ratnesh K Pandey*
Affiliation:
Department of Physics, School of Engineering, University of Petroleum and Energy Studies, Energy Acres, Bidholi via Premnagar, Dehradun248007, India
Tanuj Kumar
Affiliation:
Department of Nanoscience and Materials, Central University of Jammu, Jammu, India
Udai B Singh
Affiliation:
Department of Physics, Deen Dayal Upadhyaya Gorakhpur University, Gorakhpur, India
Shikha Awasthi
Affiliation:
Department of Physics, M M Mahila Mahavidyalaya, Ara, India
Avinash C Pandey
Affiliation:
Inter University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi, India
*
*Email of the corresponding author: pandeyratneshk@gmail.com
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Abstract

We report evolution of the surface and wetting behavior of Barium fluoride (BaF2) thin films under the effect of swift heavy ion (SHI) irradiation at different fluences. The analogy of this study may be used may be used for the development of dust resistant fabric technology for rural area. The ion irradiation has been performed at normal incidence on the films with Au ions having 100 MeV energy. Further, the wettability of irradiated surfaces is studied through contact angle of water droplet. The value of contact angle of droplet changes with irradiation, it increases from 111° to 123° with the increase in fluence from 5×1011 to 1×1013 ions/cm2. The mechanism of wettability of BaF2 is explained on the basis of increase in contact area of water droplet with surface. SHI irradiation deposits a huge amount of energy in materials due to extreme electronic excitation and it causes a large increase in the temperature of material around the ion track. Ion beam irradiation leads to the large ejection of atoms from the surface which is one of the major factors in increasing the roughness of the surface and thus for the change in contact angle.

Keywords

thin filmsputteringion beam analysis
Type
Articles
Information
MRS Advances , Volume 4 , Issue 28-29: Innovations and Technology for Rural India , 2019 , pp. 1667 - 1672
Copyright
Copyright © Materials Research Society 2019 

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References

References:

Chason, E., Mayer, T. M., Kellerman, B. K., McIlroy, D. T. and Howard, A. J., Physical Review Letters 72 (19), 3040-3043 (1994).CrossRefGoogle Scholar
Carter, G. and Vishnyakov, V., Physical Review B 54 (24), 17647-17653 (1996).CrossRefGoogle Scholar
Habenicht, S., Bolse, W., Lieb, K. P., Reimann, K. and Geyer, U., Physical Review B 60 (4), R2200-R2203 (1999).CrossRefGoogle Scholar
Agarwal, D., Chauhan, R., Avasthi, D., Khan, S., Kabiraj, D. and Sulania, I., Journal of Applied Physics 104 (2), 024304-024304-024308 (2008).CrossRefGoogle Scholar
Kumar, T., Kumar, M., Gupta, G., Pandey, R. K., Verma, S. and Kanjilal, D., Nanoscale research letters 7 (1), 1-8 (2012).Google Scholar
El-Said, A. S., Heller, R., Meissl, W., Ritter, R., Facsko, S., Lemell, C., Solleder, B., Gebeshuber, I. C., Betz, G., Toulemonde, M., Moller, W., Burgdorfer, J. and Aumayr, F., Physical Review Letters 100 (23) (2008).CrossRefGoogle Scholar
Muller, C., Benyagoub, A., Lang, M., Neumann, R., Schwartz, K., Toulemonde, M. and Trautmann, C., Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms 209, 175-178 (2003).Google Scholar
Bethe, H., Annalen der Physik 397 (3), 325-400 (1930).CrossRefGoogle Scholar
Bloch, F., Annalen der Physik 408 (3), 285-320 (1933).CrossRefGoogle Scholar
Lindhard, J., Scharff, M. and Schiøtt, H. E., Range concepts and heavy ion ranges. (Munksgaard, 1963).Google Scholar
Neumann, R., Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 151 (1), 42-55 (1999).CrossRefGoogle Scholar
Bouffard, S., Cousty, J., Pennec, Y. and Thibaudau, F., Radiation Effects and Defects in Solids 126 (1-4), 225-228 (1993).CrossRefGoogle Scholar
Khalfaoui, N., Görlich, M., Müller, C., Schleberger, M. and Lebius, H., Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 245 (1), 246-249 (2006).CrossRefGoogle Scholar
Akcöltekin, E., Peters, T., Meyer, R., Duvenbeck, A., Klusmann, M., Monnet, I., Lebius, H. and Schleberger, M., Nature Nanotechnology 2 (5), 290-294 (2007).CrossRefGoogle Scholar
Facsko, S., Dekorsy, T., Koerdt, C., Trappe, C., Kurz, H., Vogt, A. and Hartnagel, H. L., Science 285 (5433), 1551-1553 (1999).CrossRefGoogle Scholar
Frost, F., Schindler, A. and Bigl, F., Physical Review Letters 85 (19), 4116-4119 (2000).CrossRefGoogle Scholar
Gago, R., Vázquez, L., Cuerno, R., Varela, M. a., Ballesteros, C. and Albella, J. M. a., Applied Physics Letters 78 (21), 3316-3318 (2001).CrossRefGoogle Scholar
Rusponi, S., Boragno, C. and Valbusa, U., Physical Review Letters 78 (14), 2795-2798 (1997).CrossRefGoogle Scholar
Mayer, T. M., Chason, E. and Howard, A. J., Journal of Applied Physics 76 (3), 1633-1643 (1994).CrossRefGoogle Scholar
Schattat, B., Bolse, W., Klaumunzer, S., Zizak, I. and Scholz, R., Appl Phys Lett 87 (17), 173110-173110-173113 (2005).CrossRefGoogle Scholar
Bolse, W., Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 244 (1), 8-14 (2006).CrossRefGoogle Scholar
Mallick, P., Agarwal, D., Rath, C., Behera, D., Avasthi, D., Kanjilal, D. and Mishra, N., Radiation Physics and Chemistry 81 (6), 647-651 (2012).CrossRefGoogle Scholar
Gau, H., Herminghaus, S., Lenz, P. and Lipowsky, R., Science 283 (5398), 46-49 (1999).CrossRefGoogle Scholar
Blossey, R., Nat Mater 2 (5), 301-306 (2003).CrossRefGoogle Scholar
Kumar, T., Singh, U. B., Kumar, M., Ojha, S. and Kanjilal, D., Current Applied Physics 14 (3), 312-317 (2014).CrossRefGoogle Scholar
Singh, U. B., Agarwal, D. C., Khan, S. A., Kumar, M., Tripathi, A., Singhal, R., Panigrahi, B. K. and Avasthi, D. K., Applied Surface Science 258 (4), 1464-1469 (2011).CrossRefGoogle Scholar
Udai B Singh, RP Yadav, Pandey, Ratnesh K, Agarwal, DC, Pannu, Compesh and Mittal, AK, The Journal of Physical Chemistry C 120, 5755-5763 (2016)CrossRefGoogle Scholar
Pandey, R. K., Kumar, M., Khan, S. A., Kumar, T., Tripathi, A., Avasthi, D. and Pandey, A. C., Applied Surface Science 289, 77-80 (2014).CrossRefGoogle Scholar
Pandey, R. K., Kumar, M., Kumar, T., Yadav, A. C., Singh, U. B., Khan, S. A., Tripathi, A., Avasthi, D. K. and Pandey, A. C., Materials Letters 143, 309-311 (2015).CrossRefGoogle Scholar
Ziegler, J. F., Ziegler, M. D. and Biersack, J. P., Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 268 (11), 1818-1823 (2010).CrossRefGoogle Scholar