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The linear relationship of spin pumping energy in a La:YIG/Pt heterostructure used in a microwave rectifier

Published online by Cambridge University Press:  14 January 2019

Yiheng Rao ,
Huaiwu Zhang ,
Dainan Zhang ,
Lichuan Jin ,
Qinghui Yang ,
Zhiyong Zhong ,
Jie Li  and
MingMing Li
Yiheng Rao*
Affiliation:
University of Electronic Science and Technology of China, Chengdu, 610054, China
Huaiwu Zhang
Affiliation:
University of Electronic Science and Technology of China, Chengdu, 610054, China
Dainan Zhang
Affiliation:
University of Electronic Science and Technology of China, Chengdu, 610054, China
Lichuan Jin
Affiliation:
University of Electronic Science and Technology of China, Chengdu, 610054, China
Qinghui Yang
Affiliation:
University of Electronic Science and Technology of China, Chengdu, 610054, China
Zhiyong Zhong
Affiliation:
University of Electronic Science and Technology of China, Chengdu, 610054, China
Jie Li
Affiliation:
University of Electronic Science and Technology of China, Chengdu, 610054, China
MingMing Li
Affiliation:
University of Electronic Science and Technology of China, Chengdu, 610054, China
*
*(Email: yihengrao@163.com)
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Abstract

La3+ doped yttrium iron garnet films have been grown on (111) oriented gadolinium gallium garnet substrates via Liquid phase epitaxy technique as a basic material for ISHE device fabrication. Pt as a material with a large spin hall angle was used as a spin detection layer. We investigated the dependence of the spin pumping effect on the power and frequency of the excitation microwaves in La:YIG/Pt bilayers by measuring the ISHE voltage. We demonstrated that the area under the ISHE curve(SISHE) across a wide power range had a nearly linear correlation with the input microwave power (Pin). The parameter SISHE can be used to describe the spin current energy in a Pt layer which can be a useful parameter for a microwave rectifier.

Keywords

liquid-phase epitaxy (LPE)magnetic propertiesferromagnetic
Type
Articles
Information
MRS Advances , Volume 4 , Issue 9: Electronic, Photonic and Magnetic Materials , 2019 , pp. 553 - 558
Copyright
Copyright © Materials Research Society 2019 

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References

References:

Hahn, C., de Loubens, G., Klein, O., Viret, M., Naletov, V. V., and Ben Youssef, J., Physical Review B 87 (17), 174417 (2013).CrossRefGoogle Scholar
Du, C., Wang, H., Yang, F., and Hammel, P. C., Physical Review B 90 (14), 140407 (2014).CrossRefGoogle Scholar
Kajiwara, Y., Harii, K., Takahashi, S., Ohe, J., Uchida, K., Mizuguchi, M., Umezawa, H., Kawai, H., Ando, K., Takanashi, K., Maekawa, S., and Saitoh, E., Nature 464 (7286), 262 (2010).CrossRefGoogle Scholar
Castel, V., Vlietstra, N., van Wees, B. J., and Ben Youssef, J., Physical Review B 86 (13), 134419 (2012).CrossRefGoogle Scholar
Qu, D., Huang, S. Y., Hu, J., Wu, R., and Chien, C. L., Phys Rev Lett 110 (6), 067206 (2013).CrossRefGoogle Scholar
Serga, A. A., Chumak, A. V., and Hillebrands, B., Journal of Physics D-Applied Physics 43 (26), 264002 (2010).CrossRefGoogle Scholar
Jungfleisch, M. B., Lauer, V., Neb, R., Chumak, A. V., and Hillebrands, B., Applied Physics Letters 103 (2), 022411 (2013).CrossRefGoogle Scholar
Castel, V., Vlietstra, N., Ben Youssef, J., and van Wees, B. J., Applied Physics Letters 101 (13), 132414 (2012).CrossRefGoogle Scholar
Gui, Y. S., Wirthmann, A., Mecking, N., and Hu, C. M., Physical Review B 80 (6) (2009).Google Scholar
Khivintsev, Y., Kuanr, B., Fal, T., Haftel, M., Camley, R., Celinski, Z., and Mills, D., Phys Rev B 81 (5), 054436 (2010).CrossRefGoogle Scholar
Berger, L., Physical Review B 54 (13), 9353 (1996).CrossRefGoogle Scholar
Tserkovnyak, Y., Brataas, A., and Bauer, G. E., Phys Rev Lett 88 (11), 117601 (2002).CrossRefGoogle Scholar
Mosendz, O., Vlaminck, V., Pearson, J. E., Fradin, F. Y., Bauer, G. E. W., Bader, S. D., and Hoffmann, A., Physical Review B 82 (21), 214403 (2010).CrossRefGoogle Scholar
Ando, K., Takahashi, S., Ieda, J., Kajiwara, Y., Nakayama, H., Yoshino, T., Harii, K., Fujikawa, Y., Matsuo, M., Maekawa, S., and Saitoh, E., Journal of Applied Physics 109 (10), 103913 (2011).CrossRefGoogle Scholar