Hostname: page-component-76fb5796d-2lccl Total loading time: 0 Render date: 2024-04-27T03:36:02.091Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Backscatter Diffraction Measurement of Structural Reorientation after Nanoindentation of Nanoporous Gold

Published online by Cambridge University Press:  14 February 2018

Nicolas J. Briot  and
T. John Balk
Nicolas J. Briot*
Affiliation:
Department of Chemical and Materials Engineering, University of Kentucky, 177 F. Paul Anderson Tower, Lexington, KY40506, USA
T. John Balk
Affiliation:
Department of Chemical and Materials Engineering, University of Kentucky, 177 F. Paul Anderson Tower, Lexington, KY40506, USA
*
*(Email: njbr222@uky.edu)
Get access

Abstract

Characterizing individual ligaments’ behavior during deformation of nanoporous (np) structures remains crucial in further understanding the mechanical response of such materials. In this paper, we report, for the first time, quantifiable results describing the reorientation of ligament structure in np gold (np-Au) subjected to nanoindentation, based on characterization by electron backscatter diffraction (EBSD) orientation mapping. The analysis was performed on a cross-sectioned face at the center of an indent, after specimen preparation utilizing focused ion beam (FIB) techniques. This work provides insights into how the np structure accommodates the material volume displaced during nanoindentation, as well as the strain propagation under the indent. This new knowledge will be fundamental to optimizing utilization of the nanoindentation technique for measurement of np materials and, in particular, np thin films.

Keywords

nanoscalenano-indentationscanning electron microscopy (SEM)
Type
Articles
Information
MRS Advances , Volume 3 , Issue 8-9: Theory, Characterization and Modeling , 2018 , pp. 487 - 492
Copyright
Copyright © Materials Research Society 2018 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

References:

Biener, J., Hodge, A. M., Hamza, A. V., Hsiung, L. M. and Satcher, J. H., J. Appl. Phys. 97, 024301 (2005).Google Scholar
Hodge, A. M., Biener, J., Hayes, J. R., Bythrow, P. M., Volkert, C. A. and Hamza, A. V., Acta Mater. 55, 1343–1349 (2007).Google Scholar
Jin, H.-J., Kurmanaeva, L., Schmauch, J., Rösner, H., Ivanisenko, Y. and Weissmüller, J., Acta Mater. 57, 2665–2672 (2009).CrossRefGoogle Scholar
Briot, N. J. and Balk, T. J., Philos. Mag. 95, 2955–2973 (2015).CrossRefGoogle Scholar
Michael, J. R. and Kotula, P. G., Microsc. Microanal. 14, 976–977 (2008).Google Scholar
Briot, N. J. and Balk, T. J., MRS Communications, 8(1) (2017).Google Scholar
Dolph, C. K., da Silva, D. J., Swenson, M. J. and Wharry, J. P., J. Nucl. Mater. 481, 33–45 (2016).Google Scholar
Fleck, N. A., Otoyo, H. and Needleman, A., Int. J. Solids Struct. 29, 1613–1636 (1992).Google Scholar