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Effect of Ammonium Acetate Concentration on the Structural and Optical Properties of CdS Thin Film Grown by Chemical Bath Deposition Technique

Published online by Cambridge University Press:  18 May 2016

Hamda A. Al-Thani ,
Abeer A. Al Yafeai  and
Falah S. Hasoon
Hamda A. Al-Thani*
Affiliation:
National Energy and Water Research Center (NEWRC), POBOX 54111, Abu Dhabi, UAE
Abeer A. Al Yafeai
Affiliation:
National Energy and Water Research Center (NEWRC), POBOX 54111, Abu Dhabi, UAE
Falah S. Hasoon
Affiliation:
National Energy and Water Research Center (NEWRC), POBOX 54111, Abu Dhabi, UAE
*
*(Email: hamda369@hotmail.com)
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Abstract

This study focuses on understanding the influence of incorporating Ammonium Acetate into the chemical bath used for the deposition of CdS thin films, on its optical, morphology, and microstructural properties. Thus, CdS thin films were deposited on 1” × 2” microscopic glass substrates using chemical bath deposition (CBD) technique. The deposition process was carried out in a double jacket beaker with fixed chemical bath temperature of 90°C for a deposition time of 40 min. The chemical bath solution consisted of fixed concentrations of Cadmium Acetate, Thiourea, and Ammonium Hydroxide; with corresponding values of 4.8×10-4M; 0.97×10-4M; and 0.2M, respectively. However, Ammonium Acetate was incorporated into the deposition bath with concentrations that were varied from 3.0 mM to 12.2 mM. Meanwhile, for comparison purposes associated to the initial physical and chemical properties of the CdS films; reference CdS films were deposited under the same above chemical bath conditions, but in the absence of Ammonium Acetate. The pH of the chemical bath was measured during the deposition process. The films’ morphology and the chemical composition were examined by Field Emission Scanning Electron Microscopy (FE-SEM), and the Energy Dispersive spectrometer (EDS), respectively. The X-Ray Diffraction (XRD) θ/2θ technique was applied to study the structure of the films, including the lattice parameters. Atomic Force Microscopy (AFM) was used to examine the films topography and to determine the root-mean-square (RMS) surface roughness of the films as well as the grain size. Dektak Surface Profilometer was used to determine the CdS films’ thickness, where the films’ optical properties were measured using UV-Vis-NIR spectrometer. Optical energy band gap (Eg), and absorption coefficient (α) were calculated from the transmission spectral data.

Keywords

grain sizenucleation & ampgrowthphotovoltaic
Type
Articles
Information
MRS Advances , Volume 1 , Issue 37: Nanotechnology , 2016 , pp. 2603 - 2616
Copyright
Copyright © Materials Research Society 2016 

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