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Dynamically tuneable PLD grown SBN75 thin film based Electro optic modulator

Published online by Cambridge University Press:  13 June 2019

Surbhi Gupta ,
Ayushi Paliwal ,
Vinay Gupta  and
Monika Tomar Open the ORCID record for Monika Tomar [Opens in a new window]
Surbhi Gupta
Affiliation:
Department of Physics & Astrophysics, University of Delhi, Delhi-110007, India.
Ayushi Paliwal
Affiliation:
Department of Physics & Astrophysics, University of Delhi, Delhi-110007, India.
Vinay Gupta
Affiliation:
Department of Physics & Astrophysics, University of Delhi, Delhi-110007, India.
Monika Tomar*
Affiliation:
Department of Physics, Miranda House, University of Delhi, Delhi-110007, India.
*
*(Email: monikatomar@gmail.com)
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Abstract:

Present work reports the growth of Strontium Barium Niobate (Sr0.75 Ba0.25 Nb2 O6, SBN 75)thin films using Pulsed laser deposition (PLD) technique for possible realization of electrically tunable modulators. Structural and optical properties of grown SBN75 thin film were investigated indicating the growth of high quality polycrystalline and optically transparent. Prism coupling technique was further utilized for coupling the incident laser light λ = 633 nm with the grown SBN75 thin film. The guided EM radiation could be further coupled with the electric field for the realization of EO modulator.

Keywords

optoelectronicphotonicthin film
Type
Articles
Information
MRS Advances , Volume 4 , Issue 41-42: Electronics and Photonics , 2019 , pp. 2265 - 2269
Copyright
Copyright © Materials Research Society 2019 

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References

References:

Zhang, H.Y., He, X.H., Shih, Y.H., and Tang, S.H., Opt. Commun. 86, 509 (1991).CrossRefGoogle Scholar
Wooten, E.L., Kissa, K.M., Yi-Yan, a., Murphy, E.J., Lafaw, D. a., Hallemeier, P.F., Maack, D., Attanasio, D.V., Fritz, D.J., McBrien, G.J., and Bossi, D.E., IEEE J. Sel. Top. Quantum Electron. 6, 69 (2000).CrossRefGoogle Scholar
Tayebati, P., Trivedi, D., and Tabat, M., Appl. Phys. Lett. 69, 1023 (1996).CrossRefGoogle Scholar
Xu, Y., Chen, C.J., Xu, R., and Mackenzie, J.D., 44, (1991).Google Scholar
Trivedi, D., Tayebati, P., and Tabat, M., Appl. Phys. Lett. 68, 3227 (1996).CrossRefGoogle Scholar
Babicheva, V.E., V Zhukovsky, S., and V Lavrinenko, A., Opt. Express 22, 28890 (2014).CrossRefGoogle Scholar
Huang, C., Bhalla, A.S., and Guo, R., Appl. Phys. Lett. 86, 211907 (2005).CrossRefGoogle Scholar
Zhu, Y.Y., Xiao, R.F., and Wong, G.K.L., J. Appl. Phys. 82, 4908 (1997).CrossRefGoogle Scholar
Kakimoto, K., Kakemoto, H., Baba, A., Fujita, S., and Masuda, Y., J. Eur. Ceram. Soc. 21, 1569 (2001).CrossRefGoogle Scholar
Gupta, S., Paliwal, A., Guo, R., Bhalla, A.S., Gupta, V., and Tomar, M., Opt. Mater. (Amst). 85, 26 (2018).CrossRefGoogle Scholar
Infortuna, A., Muralt, P., Cantoni, M., Tagantsev, A., and Setter, N., J. Eur. Ceram. Soc. 24, 1573 (2004).CrossRefGoogle Scholar
Boulay, N., Cuniot-Ponsard, M., Desvignes, J.M., and Bellemain, a., Ferroelectrics 353, 10 (2007).CrossRefGoogle Scholar
Gupta, S., Paliwal, A., Gupta, V., and Tomar, M., Appl. Surf. Sci. 458, 139 (2018).CrossRefGoogle Scholar
Neurgaonkar, R.R., Hall, W.F., Oliver, J.R., Ho, W.W., and Cory, W.K., Ferroelectrics 87, 167 (1988).CrossRefGoogle Scholar
Fernáandez, F.E., Liu, H., Jin, C., and Jia, W., 4587, (2016).Google Scholar
Schwyn Thöny, S., Youden, K.E., Harris, J.S., and Hesselink, L., Appl. Phys. Lett. 65, 2018 (1994).CrossRefGoogle Scholar
Yin, Y., Fu, X.H., and Ye, H., Thin Solid Films 519, 6403 (2011).CrossRefGoogle Scholar
Yum, T.-Y., Mak, C.-L., and Wong, K.-H., Appl. Surf. Sci. 252, 4829 (2006).CrossRefGoogle Scholar
Abduraoof, K., Balaji, R., Jayakumar, S., and Joshi, G.M., Ferroelectrics 481, 196 (2015).CrossRefGoogle Scholar
Qu, Y., Li, A., Shao, Q., Tang, Y., Wu, D., Mak, C.L., Wong, K.H., and Ming, N., Mater. Res. Bull. 37, 503 (2002).CrossRefGoogle Scholar
Lu, S.G., Mak, C.L., and Wong, K.H., J. Appl. Phys. 94, 3422 (2003).CrossRefGoogle Scholar
Yao, Y.B., Liu, W.C., Mak, C.L., Wong, K.H., Tam, H.L., and Cheah, K.W., Thin Solid Films 519, 52 (2010).CrossRefGoogle Scholar
Dorywalski, K., Andriyevsky, B., Cobet, C., Piasecki, M., Kityk, I.V., Esser, N., Łukasiewicz, T., and Patryn, A., Opt. Mater. (Amst). 35, 887 (2013).CrossRefGoogle Scholar