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Defect characterization of UMG mc-Si solar cells using LBIC and luminescence imaging techniques

Published online by Cambridge University Press:  17 April 2018

L.A. Sánchez Open the ORCID record for L.A. Sánchez [Opens in a new window] ,
A. Moretón ,
M. Guada ,
S. Rodríguez-Conde ,
O. Martínez  and
J. Jiménez
L.A. Sánchez*
Affiliation:
GdS-Optronlab, Dpto. Física de la Materia Condensada, Universidad de Valladolid, Edificio LUCIA, Paseo de Belén 19, 47011Valladolid, Spain.
A. Moretón
Affiliation:
GdS-Optronlab, Dpto. Física de la Materia Condensada, Universidad de Valladolid, Edificio LUCIA, Paseo de Belén 19, 47011Valladolid, Spain.
M. Guada
Affiliation:
GdS-Optronlab, Dpto. Física de la Materia Condensada, Universidad de Valladolid, Edificio LUCIA, Paseo de Belén 19, 47011Valladolid, Spain.
S. Rodríguez-Conde
Affiliation:
GdS-Optronlab, Dpto. Física de la Materia Condensada, Universidad de Valladolid, Edificio LUCIA, Paseo de Belén 19, 47011Valladolid, Spain.
O. Martínez
Affiliation:
GdS-Optronlab, Dpto. Física de la Materia Condensada, Universidad de Valladolid, Edificio LUCIA, Paseo de Belén 19, 47011Valladolid, Spain.
J. Jiménez
Affiliation:
GdS-Optronlab, Dpto. Física de la Materia Condensada, Universidad de Valladolid, Edificio LUCIA, Paseo de Belén 19, 47011Valladolid, Spain.
*
*(Email: sandom.luis@gmail.com)
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Abstract

Upgraded metallurgical-grade silicon (UMG Si) solar cells with different ranges of efficiencies were characterized through electroluminescence imaging (ELi) and light-beam induced current (LBIC) measurements. The results showed a good correlation between the EL intensity and the efficiency of the solar cells. ELi images gave a bright contrast at the defects, grain boundaries and intragrain defects, and dark contrast inside the grain bodies. Metallic impurities are much more present in some cells due to the directional solidification of the Si ingot. Local short-circuit current mapping with LBIC measurements revealed a bright zone in the neighborhoods of the defects due to the depletion of impurities. Internal quantum efficiencies (IQE) and effective diffusion lengths (Leff) were calculated using different excitation wavelengths. High resolution LBIC measurements revealed micrometric clusters of impurities around intragrain defects.

Keywords

photovoltaicdefectsgrain boundarieslaserluminescence
Type
Articles
Information
MRS Advances , Volume 3 , Issue 57-58: Electronic and Photonic Materials , 2018 , pp. 3359 - 3365
Copyright
Copyright © Materials Research Society 2018 

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References

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