Microscopy and Microanalysis: Volume 13 -

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Microscopy in Nanotechnology (99)

One-dimensional Nanomaterials: Microscopy and Nano-measurements (49)

Advances in Electron Energy Loss Spectroscopy and Energy-Filtered Imaging (43)

Metallographic Techniques and Material Characterization (41)

Quantitative X-ray Microanalysis (40)

High Resolution Characterization of Nanoelectronic Materials for Advanced Semiconductor Process Development (38)

Structural Analysis of Biological Systems: an Integrative Understanding of Organellar, Cellular, and Organismal Function (36)

Atom Probe Tomography: an Evolving Technique for Nanostructural Characterization (32)

Macromolecular Complexes as Visualized by Cryo-EM (31)

Advances in high-resolution electron microscopy (30)

FIB Instrumentation and Application Advances for Physical and Biological Sciences (25)

Electron Microscopy Research in an Aberration-free Environment: Applications (23)

EBSD: Traditional and Advanced Applications (19)

Tomography in Physical and Biological Sciences (19)

Variable Pressure Electron Microscopy and Electron Beam Assisted Deposition (16)

Cell Pathology (15)

Metallography, History and the Fine Arts (15)

Biomaterials (14)

Electron Crystallography and Precession Electron Diffraction (14)

Imaging in Cancer Biology (14)

Aberration Correction in the Electron Microscope (13)

Microscopy, Imaging, and Training in the Digital Age (13)

Characterization of Oxides (12)

Failure analysis: Real-world Applications and Case Studies (12)

Scanning Probe Microscopy for Nanoscale Characterization of Functional Materials and Electronic Devices (12)

Techniques and Applications of Confocal Microscopy (12)

Large Chamber Scanning Electron Microscopy (11)

Spectral Imaging and Data Analysis: Where are We Now and Where are We Going? (11)

Advances in Biological Microanalysis: A Symposium Dedicated to the Memory of Andrew Somlyo (10)

Advanced Light Microscopy Applications for Biological Questions (9)

Main Platform Session: Biophotonics (9)

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences (9)

Stereology and 3D Digital Imaging (9)

Vascular Corrosion Casting (9)

Cryo-SEM for Biological and Materials Samples (8)

Microscopy and Paleontology: Digging Deeper into Dinosaurs (8)

X-ray Microscopy in Physical and Biological Sciences (8)

Electron Holography (7)

ImageJ and Applications in Microscopy (7)

Multiscale Imaging of the Nervous System (7)

New Phase Contrast Methods for TEM (7)

Core Facility Management (6)

Muscle and Motility (6)

Oxidation / Corrosion (6)

Biological Sciences ?V General (5)

Contamination Control in Electron and Ion Microscopy (5)

Special Topic: Microscopy and Microanalysis in Marine Biology (2)

Atomic Force Microscopy (AFM) and Related Microscopy Techniques and Applications (1)

High Pressure Freezing for Electron Microscopy of Biological Specimens (1)

A Novel Sample Freezing Method (1)

Electron Tomography for Materials Science (1)

Freeze Substitution Method: Tutorial and Roundtable Discussion (1)

IMS Henry Clifton Sorby Award Lecture (1)

LACSBI: Incoherent Imaging for Quantitative TEM (1)

X-ray microCT Principles and Examples (1)

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Microscopy and Microanalysis
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Volume 13 - September 2007

Contents

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Microscopy, Imaging, and Training in the Digital Age

Research Article

Constructing a Dedicated Microscopy Computer Network.
RE Edelmann, ML Duley
Published online by Cambridge University Press:

05 August 2007, pp. 1718-1719
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Prosumer Digital SLR Cameras vs Dedicated Scientific Cameras
ML Duley, RE Edelmann
Published online by Cambridge University Press:

05 August 2007, pp. 1720-1721
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Enhancing Depth of Field in LCSEM Scenes by Sharpness Map Partitioning
H Hariharan, A Koschan, B Abidi, D Page, M Abidi, J Frafjord, S Dekanich
Published online by Cambridge University Press:

05 August 2007, pp. 1722-1723
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Virtual SEM (VSEM) - Evaluation of a Teaching and Training Tool
MGC Martin, DD M Holburn, DN H M Caldwell, MB C Bernie
Published online by Cambridge University Press:

05 August 2007, pp. 1724-1725
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Database Solution to Particle-by-Particle Analysis of Mixed Mineral Dusts
KE Harris, KL Bunker, R Hoch, RJ Lee
Published online by Cambridge University Press:

05 August 2007, pp. 1726-1727
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Comparison of Materials Characterization Performed by Low Voltage Desktop SEM and Standard High Resolution SEM
J Lawrance, J Carruthers, J Jiao, S Berger
Published online by Cambridge University Press:

05 August 2007, pp. 1728-1729
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Electron Microscopy Database: A Resource for Teaching and Learning Quantitative Methods in Electron Microscopy and Spectroscopy
P Voyles, J Yang, J-M Zuo, S Stemmer
Published online by Cambridge University Press:

05 August 2007, pp. 1730-1731
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Contamination Control in Electron and Ion Microscopy

Research Article

Effect of Cleaning Parameters on Cleaning Effectiveness in an SEM Equipped with an RF Plasma Anti-Contamination Device
R Garcia, AD Batchelor, CB Mooney, AD Garetto, R Vane, DP Griffis
Published online by Cambridge University Press:

05 August 2007, pp. 1732-1733
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Using a Thickness Monitor to Measure Contaminant Removal by Evactron Cleaning as a Function of Operating Parameters
MM Gleason, CG Morgan, R Vane
Published online by Cambridge University Press:

05 August 2007, pp. 1734-1735
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Quantification of Contamination Using Quartz Thickness Monitors
CG Morgan, MM Gleason, R Vane
Published online by Cambridge University Press:

05 August 2007, pp. 1736-1737
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Effect of Collimators on Evactron Cleaning of EDS Detector Windows
CG Morgan, MM Gleason, R Vane
Published online by Cambridge University Press:

05 August 2007, pp. 1738-1739
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

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