Microscopy and Microanalysis: Volume 8 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract

Misorientation Mapping for Visualization of Plastic Strain Via Electron Back-Scattered Diffraction

A New Method for Analyzing Electron Backscatter Diffraction (EBSD) Data for Texture using Inverse Pole Figures

The Random Orientation Probability in Consecutive Inverse Pole Figure Method for Texture Determination

Another Way to Implement Diffraction Contrast in SEM

Alternatives to Image Quality (IQ) Mapping in EBSD

Comparison of OIM and XRD Texture Determinations in a Deformation Processed β-Ti +Y Metal-Metal Composite

Ebsd Characterization of Texture in Tungsten-Rhenium Foils

Electron Back-Scattered Diffraction Misorientation Mapping Applied to Stress Corrosion Cracking of Stainless Steels

EBSD Study of Martensite in a Dual Phase Steel

Development of a Simulation Tool for “Real World” SEM Applications

Electron Range at Low Energy (Eo < 10 KEV): Atomic Number Dependant ?

Ultra-Low-Voltage Scanning Electron Microscopy In The FEG -SEM

Utilisation of Field Emission Scanning Electron Microscopy to Characterise an Active Brazing Alloy (ABA) Produced by an Electroless Plating Technique

FE-SEM examination of Microalloyed Hypereutectoid Steels

Study of self-assembled InAs quantum dots on InP nano-templates by low voltage scanning electron microscopy cathodoluminescence

New tools for Micro-Characterization at low Beam voltages (The right tools for the right Job)

Fish-eye Optics for the Scanning Electron Microscope

Energy filtered imaging in a FEG-SEM for enhanced dopant contrast

A Study of the Effectiveness of the Removal of Hydrocarbon Contamination by Oxidative Cleaning Inside the Sem

Low Temperature Scanning Electron Microscopy of Irregular Snow Crystals

Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract