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Volume 11 - Issue S02 - August 2005

Contents

Page 10 of 54

Scanned Probe Microscopy and Nanoanalysis: Probing Properties at the Nanoscale

Research Article

  • Near-Field Acoustic Holography as a High Resolution Sub-Surface Imaging System on Scanning Probe Microscopy Platform: Seeing the Invisible

  • G Shekhawat, V P Dravid
  • Published online by Cambridge University Press:
    01 August 2005, pp. 362-363
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Wear of Si Cantilever Tips used in Atomic Force Acoustic Microscopy

  • R H Geiss, M Kopycinska-Müller, D C Hurley
  • Published online by Cambridge University Press:
    01 August 2005, pp. 364-365
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Ferroelectricity and Domain Dynamics in One Dimensional Single Crystalline BaTiO3 Nanowire: A Piezoresponse Force Microscopy (PFM) Study

  • M-F Yu, Z Wang, J Hu, A Suryavanshi
  • Published online by Cambridge University Press:
    01 August 2005, pp. 366-367
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Nano-crystals from Ionic Liquids: Formation and Characterization Using Atomic Force Microscopy

  • J J Nainaparampil, J H Sanders, K C Eapen, J S Zabinski
  • Published online by Cambridge University Press:
    01 August 2005, pp. 368-369
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Recent Advancements in Nanomechanical Characterization Techniques and Associated Technologies

  • O L Warren, S A S Asif, A Dwivedi, W Che, T J Wyrobek
  • Published online by Cambridge University Press:
    01 August 2005, pp. 370-371
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Growth and Characterization of Self-assembled Nanofibers

  • M E Salmon, P E Russell, E B Troughton
  • Published online by Cambridge University Press:
    01 August 2005, pp. 372-373
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • C–AFM study on high–k oxide NfO2 films

  • J Park
  • Published online by Cambridge University Press:
    01 August 2005, pp. 374-375
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Implantation, Sputtering and Electromigration: Kelvin Probe Microscopy of Focussed Ion Beam Processed SIMOX.

  • M A Stevens-Kalceff, T L Sobey
  • Published online by Cambridge University Press:
    01 August 2005, pp. 376-377
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Surface Characterizations of Sulfamerazine Polymorphs Using Atomic Force Microscopy, Transmission Light Microscopy and Raman Microspectroscopy

  • X Cao, C Sun, T J Thamann
  • Published online by Cambridge University Press:
    01 August 2005, pp. 378-379
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Environmental Controls for Scanning Probe Microscopy with Applications in NanoScience and Nanotechnology Development

  • F M Serry
  • Published online by Cambridge University Press:
    01 August 2005, pp. 380-381
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Measurement of van der Waal’s Forces Between Iron/Iron Surfaces in Water by Atomic Force Microscopy

  • D Blundell, S Wai
  • Published online by Cambridge University Press:
    01 August 2005, pp. 382-383
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Variable Pressure Electron Microscopy: Advances in the Nanotechnology and Biomaterials Age

Research Article

  • Ultra-High Resolution Imaging and Metrology with Low Vacuum SEM

  • B L Thiel, M Toth, W R Knowles
  • Published online by Cambridge University Press:
    01 August 2005, pp. 384-385
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • A Strategy for Selective Low Vacuum Imaging and Focused Ion Beam Milling of Multi-Layer Optoelectronic Polymer Devices

  • D J Stokes, C M Ramsdale, H Mulders, A M Donald
  • Published online by Cambridge University Press:
    01 August 2005, pp. 386-387
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Variable Pressure/Environmental SEM a Powerful Tool for Nanotechnology and Nanomanufacturing

  • M T Postek, A E Vladár
  • Published online by Cambridge University Press:
    01 August 2005, pp. 388-389
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Artifact-Free Imaging of Photolithographic Masks by Environmental Scanning Electron Microscopy

  • M Toth, B L Thiel, M A Coy, J G Marshman, W R Knowles
  • Published online by Cambridge University Press:
    01 August 2005, pp. 390-391
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Direct Patterning of Nanometer-Scale Structures on Insulating Substrates with Variable Pressure Electron Beam Lithography (VP-eBL)

  • B D Myers, V P Dravid
  • Published online by Cambridge University Press:
    01 August 2005, pp. 392-393
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Challenges and Progress towards Low Voltage Imaging in VPSEM

  • B J Griffin
  • Published online by Cambridge University Press:
    01 August 2005, pp. 396-397
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Direct Comparison of Various Gaseous Secondary Electron Detectors in the Variable Pressure Scanning Electron Microscope

  • M R Phillips, S W Morgan
  • Published online by Cambridge University Press:
    01 August 2005, pp. 398-399
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Beam Blanking Studies in Environmental Scanning Electron Microscopy

  • H Dobberstein, N J Purser, T W Fairhead, D J Stokes, R W Knowles
  • Published online by Cambridge University Press:
    01 August 2005, pp. 400-401
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 10 of 54