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Volume 15 - Supplement S2 - July 2009

Contents

Page 35 of 39

Physical Sciences

Irradiation Damage and Modifications of Materials

Abstract

  • Radiation Response of Nanocrystalline Rutile (TiO2)

  • J Zhang, J Lian, F Namavar, RC Ewing
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1366-1367
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of Oxide Nano-clusters in Mechanically Alloyed Nickel Alloys

  • J Bentley, DT Hoelzer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1368-1369
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Surface Morphology and Microstructure of Ag ion-implanted Pyrolytic Carbon

  • YB Chen, RS Zhou, KD Li, QM Wei, LM Wang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1370-1371
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Bubble formation in He implanted Cu and Au

  • QM Wei, L Wang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1372-1373
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atom Probe Tomography of Radiation-Induced Precipitation in Ferritic-Martensitic Alloy HCM12A

  • Z Jiao, J Penisten, G Was, R Martens
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1374-1375
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Three Dimensional Characterization of Xe Inclusions Ion-implanted in Al

  • M Song, H Matsumoto, M Shimojo, K Mitsuishi, K Furuya
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1376-1377
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TEM study of Amorphous Phase Formation in Cobalt Nanoparticles

  • DJ Sprouster, DJ Llewellyn, P Kluth, LL Araujo, JD Fitzgerald, B Johannessen, MC Ridgway
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1378-1379
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Studying the Electronic Structure of Uranium Dioxide

  • JA Aguiar, M Asta, N Grønbech-Jensen, ND Browning
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1380-1381
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • EELS Analysis of Radiation Induced Structural Transformations in Fluoride Compounds

  • KS Rao, F Cosandey, GG Amatucci
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1382-1383
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Auger Electron Spectroscopy of Kernite: Coaxing Useful Information Out of a Recalcitrant Specimen

  • D Meier, JM Davis, EP Vicenzi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1384-1385
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Characterization of Materials for Responsible Energy Generation and Use

Abstract

  • Photoluminescence Microscopy Study of Single Impurities and Defects in PV Materials

  • A Mascarenhas, B Fluegel
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1388-1389
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Microstructural Analysis of CdTe Thin Films using EBSD and FIB

  • MM Nowell, SI Wright, JO Carpenter
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1390-1391
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Application of Dual Beam FIB to the Metrology of Nanostructured Photovoltaic Devices

  • G McMahon, J Rybczynski, Y Wang, Y Gao, N Argenti, K Kempa, ZF Ren, MJ Naughton
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1392-1393
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-situ Spatial and Temporal Studies of Electrochemistry in Advanced High Temperature Batteries Under Operating Conditions

  • J Rijssenbeek, Y Gao, Z Zhong, N Jisrawi, I Ignatov, M Croft
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1394-1395
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • EELS and HRTEM Analysis of Surface Phase in Nanostructured LiMn1.5Ni0.5O4 Battery Materials

  • F Cosandey, N Marandian Hagh, GG Amatucci
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1396-1397
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of PbTe-based Thermoelectric Materials by Scanning/ Transmission Electron Microscopy (S/TEM)

  • J He, S Girard, JR Sootsman, MG Kanatzidis, VP Dravid
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1400-1401
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • High Resolution Microscopy Analysis of a New Precipitate Phase in the High-Temperature Shape Memory Alloy Ni30Pt20Ti50

  • L Kovarik, F Yang, RD Noebe, MJ Mills
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1402-1403
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Microscopy of Oxide Nanoparticles for Energy Applications

  • J Basu, S Bhowmick, JP Winterstein, C Wang, Y Xue, CB Carter
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1404-1405
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 35 of 39