Microscopy and Microanalysis: Volume 13 - Issue S02

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Volume 13 - Issue S02 - August 2007

Contents

Page 5 of 44

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Quantitative X-ray Microanalysis

Research Article

Use of Multilayer Gratings to Improve the X-ray Spectral Analysis at Low Photon Energy
P Jonnard, R Benbalagh, J-M André
Published online by Cambridge University Press:

05 August 2007, pp. 162-163
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Nano-mineralogy Studies by Advanced Electron Microscopy
C Ma, G Rossman
Published online by Cambridge University Press:

05 August 2007, pp. 164-165
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

New Development of a Wavelength-dispersive X-ray Spectrometer up to 2 keV for a Conventional Analytical Transmission Electron Microscope
T Masami, Y Yuichi, K Masato
Published online by Cambridge University Press:

05 August 2007, pp. 166-167
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Applications of the Field Emission Electron Probe Microanalyzer to Metals
A Sato, M Takakura, N Mori, C Nielsen
Published online by Cambridge University Press:

05 August 2007, pp. 168-169
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Cryo-SEM for Biological and Materials Samples

Research Article

Cytoskeletal Elements Imaged with High Resolution Cryo-SEM and STEM Tomography
P Walther, H Krisp
Published online by Cambridge University Press:

05 August 2007, pp. 170-171
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Quantitative microstructure analysis of complex suspensions using Cryo-FIB-nanotomography
L Holzer
Published online by Cambridge University Press:

05 August 2007, pp. 172-173
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Variable Pressure Electron Microscopy and Electron Beam Assisted Deposition

Research Article

Variable-Pressure Soft-Electron Beam Lithography (VP Soft-eBL)
B Myers, Z Pan, S Donthu, V Dravid
Published online by Cambridge University Press:

05 August 2007, pp. 174-175
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

FIB Instrumentation and Application Advances for Physical and Biological Sciences

Research Article

Assembly and Analysis of Ordered Semiconductor Quantum Dot Arrays by Focused Ion Beam Nanofabrication and Tomography
R Hull, J Graham, A Kubis, A Portavoce, F Ross
Published online by Cambridge University Press:

05 August 2007, pp. 176-177
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Resolution and Contrast in Dual Beam Imaging of Three Dimensional Structures of Microelectronic Devices
J Evertsen, E Lifshin
Published online by Cambridge University Press:

05 August 2007, pp. 178-179
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

A High Brightness Plasma Source for Focused Ion Beam Applications
NS Smith, DE Kinion, PP Tesch, RW Boswell
Published online by Cambridge University Press:

05 August 2007, pp. 180-181
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Techniques and Applications of Confocal Microscopy

Research Article

Using Confocal Microscopy to Explore Cardiac Development and Disease
J Potts, T Nesbitt, M Yost, R Goodwin
Published online by Cambridge University Press:

05 August 2007, pp. 182-183
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

X-ray Microscopy in Physical and Biological Sciences

Research Article

Recent Developments in the Field of X-ray Nano- and Micro-CT at the Centre for X-ray Tomography of the Ghent University
J Vlassenbroeck, B Masschaele, M Dierick, V Cnudde, Y De Witte, K Pieters, L Van Hoorebeke, P Jacobs
Published online by Cambridge University Press:

05 August 2007, pp. 184-185
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Scanning Probe Microscopy for Nanoscale Characterization of Functional Materials and Electronic Devices

Research Article

AFM Nanoindentation of Polymers
G Moeller, V Domnich
Published online by Cambridge University Press:

05 August 2007, pp. 186-187
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Microcharacterization of Semiconductor Device Materials using Kelvin Probe Microscopy
M Stevens-Kalceff, T Sobey, D Kruss
Published online by Cambridge University Press:

05 August 2007, pp. 188-189
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Atom Probe Tomography: an Evolving Technique for Nanostructural Characterization

Research Article

Recent Advances in Analysis of Organic Materials using LEAPÆ Tomography
T Prosa, S Kostrna Keeney, TF Kelly
Published online by Cambridge University Press:

05 August 2007, pp. 190-191
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

3D Atom Probe Tomography and High Resolution Electron Microscopy of Immiscible Copper/Niobium Metallic Multilayers
A Genç, Ohio State University, University of North Texas, Ohio State University, University of North Texas
Published online by Cambridge University Press:

05 August 2007, pp. 192-193
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Effects of Cooling Rate on the Microstructure of a Commercial Ni-based Superalloy Using Atom Probe Tomography
PM Sarosi, MK Miller, D Isheim, M Mills
Published online by Cambridge University Press:

05 August 2007, pp. 194-195
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Application of Spatial Distribution Mapping to the Investigation of Alloys
EA Marquis, BP Geiser, M Hekmaty, DJ Larson
Published online by Cambridge University Press:

05 August 2007, pp. 196-197
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Stereology and 3D Digital Imaging

Research Article

Fully Automatic Registration of Electron Microscopy Images with High and Low Resolution
V Kaynig, B Fischer, R Wepf, JM Buhmann
Published online by Cambridge University Press:

05 August 2007, pp. 198-199
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

ImageJ and Applications in Microscopy

Research Article

ImageJ, A Useful Tool for Biological Image Processing and Analysis
JB Sheffield
Published online by Cambridge University Press:

05 August 2007, pp. 200-201
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

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Volume 13 - Issue S02 - August 2007

Quantitative X-ray Microanalysis

Research Article

Cryo-SEM for Biological and Materials Samples

Research Article

Variable Pressure Electron Microscopy and Electron Beam Assisted Deposition

Research Article

FIB Instrumentation and Application Advances for Physical and Biological Sciences

Research Article

Techniques and Applications of Confocal Microscopy

Research Article

X-ray Microscopy in Physical and Biological Sciences

Research Article

Scanning Probe Microscopy for Nanoscale Characterization of Functional Materials and Electronic Devices

Research Article

Atom Probe Tomography: an Evolving Technique for Nanostructural Characterization

Research Article

Stereology and 3D Digital Imaging

Research Article

ImageJ and Applications in Microscopy

Research Article