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Zone Axis STEM Defect Imaging Based on Electron Kossel Patterns

Published online by Cambridge University Press:  27 August 2014

M.L. Bowers ,
P.J. Phillips ,
J. Kwon ,
M.C. Brandes ,
M.J. Mills  and
M. De Graef
M.L. Bowers
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus OH 43201
P.J. Phillips
Affiliation:
Department of Physics, University of Illinois at Chicago, Chicago IL 60607
J. Kwon
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh PA 15213
M.C. Brandes
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus OH 43201
M.J. Mills
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus OH 43201
M. De Graef
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh PA 15213

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 114 - 115
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Phillips, P.J., Mills, M.J., and Graef, M. De Philosophical Magazine 91 (2011) 2081-2101.Google Scholar
[2] Phillips, P.J., Brandes, M.C., Mills, M.J., and Graef, M. De Ultramicroscopy 111 (2011) 1483-1487.Google Scholar
[3] Graef, M. De Microscopy and Microanalysis, 18 (2012). 682-683.Google Scholar
[4] Portions of this work were funded under NSF Grant #DMR-0907561.Google Scholar
[5] MDG was supported by the Air Force Office of Scientific Research, MURI contract #FA9550-12-1-0458.Google Scholar