Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-26T03:43:16.750Z Has data issue: false hasContentIssue false
  • English
  • Français

Why We Need to Use 3D Fourier Transform Analysis to Evaluate a High-performance TEM

Published online by Cambridge University Press:  25 July 2016

Kazuo Ishizuka  and
Koji Kimoto
Kazuo Ishizuka
Affiliation:
National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, Japan HREM Research Inc., 14-48 Matsukazedai, Higashimatsuyama, Saitama, Japan
Koji Kimoto
Affiliation:
National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, Japan Department of Applied Chemistry, Kyushu University, 1-1 Namiki, Tsukuba, Ibaraki, Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 24 - 25
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Haider, M., et al, Nature 392 (1998). p. 768.CrossRefGoogle Scholar
[2] Krivanek, K., Dellby, N. & Lupini, A. Ultramicroscopy 78 (1999). p. 1.CrossRefGoogle Scholar
[3] Haider, M., et al, Microsc Microanal 13(S2 (2007). p. 1156CD.CrossRefGoogle Scholar
[4] Barthel, J. & Thust, A. Physical Review Letters 101(2008) p. 200801.CrossRefGoogle Scholar
[5] Haider, M., et al, Micros. Microanal 16 (2010). p. 393.CrossRefGoogle Scholar
[6] Kimoto, K, et al, Ultramicroscopy 121 (2012). p. 31.CrossRefGoogle Scholar
[7] Kimoto, K, et al, Ultramicroscopy 134 (2013). p. 86.CrossRefGoogle Scholar
[8] Ishizuka, K. Ultramicroscopy 5 (1980). p. 55.CrossRefGoogle Scholar
[9] This study was partly supported by the JST Research Acceleration Program and the Nano Platform Program of MEXT, Japan.Google Scholar