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Very Large Solid Angle Windowless SDD Applications for Nanostructure and Semiconductor Applications

Published online by Cambridge University Press:  27 August 2014

S. Bhadare ,
P. Philips ,
T. Paulauskas ,
R. Klie ,
N. Rowlands  and
A. Nicholls
S. Bhadare
Affiliation:
Oxford Instruments NanoAnalysis, Halifax Road, High Wycombe, HP12 3SE, UK
P. Philips
Affiliation:
University of Illinois 845 W Taylor Street, Chicago, IL 60607
T. Paulauskas
Affiliation:
University of Illinois 845 W Taylor Street, Chicago, IL 60607
R. Klie
Affiliation:
University of Illinois 845 W Taylor Street, Chicago, IL 60607
N. Rowlands
Affiliation:
Oxford Instruments NanoAnalysis, 300Baker Avenue, Suite 150, Concord, MA 1742
A. Nicholls
Affiliation:
University of Illinois 845 W Taylor Street, Chicago, IL 60607

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 598 - 599
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Watanabe, M.and Wade, C.A. Microsc. Microanal., 19 (2013), Suppl. 2, Cambridge University Press,1264-1265.Google Scholar