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Variation of Σ3 and Coherent Σ3 Boundary Fraction with Thickness in Nanometric Cu Films

Published online by Cambridge University Press:  09 October 2013

X. Liu ,
A.P. Warren ,
T.N. Nuhfer ,
G.S. Rohrer ,
K.R. Coffey  and
K. Barmak
X. Liu
Affiliation:
A.P. Warren
Affiliation:
T.N. Nuhfer
Affiliation:
G.S. Rohrer
Affiliation:
K.R. Coffey
Affiliation:
K. Barmak
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1774 - 1775
Copyright
Copyright © Microscopy Society of America 2013