Utilizing Intensity Ratios To Characterize Glass Fragments Via Micro-X-ray Fluorescence

Andrew H. Lee

doi:10.1017/S1431927615010831

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Utilizing Intensity Ratios To Characterize Glass Fragments Via Micro-X-ray Fluorescence

Published online by Cambridge University Press: 23 September 2015

Andrew H. Lee

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Andrew H. Lee*: Affiliation:
EDAX Inc., Mahwah, NJ USA

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2011 - 2012

DOI: https://doi.org/10.1017/S1431927615010831 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2015

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Utilizing Intensity Ratios To Characterize Glass Fragments Via Micro-X-ray Fluorescence

Volume 21, Supplement S3
Andrew H. Lee ^(a1)
DOI: https://doi.org/10.1017/S1431927615010831

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Utilizing Intensity Ratios To Characterize Glass Fragments Via Micro-X-ray Fluorescence

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