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The Utility of Xe-Plasma FIB for Preparing Aluminum Alloy Specimens for MEMS-based In Situ Double-Tilt Heating Experiments

Published online by Cambridge University Press:  05 August 2019

L. F. Allard*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
D. N. Leonard
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
J. D. Poplawsky
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
M. F. Chisholm
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
B. D. Eckhart
Affiliation:
Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
A. Shyam
Affiliation:
Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
F. S. Walden
Affiliation:
Protochips Inc., Morrisville, NC, USA.
B. B. Larson
Affiliation:
Protochips Inc., Morrisville, NC, USA.
R. Kelly
Affiliation:
Thermo Fisher Scientific, Hillsboro, OR, USA.
A. Stokes
Affiliation:
Thermo Fisher Scientific, Hillsboro, OR, USA.
W. C. Bigelow
Affiliation:
Department of Materials Science & Engineering, University of Michigan, Ann Arbor, MI, USA.
*
*Corresponding author: allardLFjr@ornl.gov

Abstract

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Type
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Copyright
Copyright © Microscopy Society of America 2019 

References

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[5]Research supported by U.S. Department of Energy (DOE), Office of Energy Efficiency and Renewable Energy, Vehicle Technologies Office, Propulsion Materials ProgramGoogle Scholar