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Using (S)TEM Techniques to Study Energy Related Materials at the Nanoscale

Published online by Cambridge University Press:  27 August 2014

John C. Walmsley ,
Per Erik Vullum  and
Randi Holmestad
John C. Walmsley
Affiliation:
SINTEF Materials and Chemistry, N-7465 Trondheim, Norway Department of Physics, Norwegian University of Science and Technology (NTNU), N-7491 Trondheim, Norway
Per Erik Vullum
Affiliation:
SINTEF Materials and Chemistry, N-7465 Trondheim, Norway Department of Physics, Norwegian University of Science and Technology (NTNU), N-7491 Trondheim, Norway
Randi Holmestad
Affiliation:
Department of Physics, Norwegian University of Science and Technology (NTNU), N-7491 Trondheim, Norway

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 414 - 415
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Vullum, PE, Nord, M, Thomassen, SF, Boothroyd, C, Holmestad, R, Fimland, BO, Reenaas, TW Quantitative strain analysis of InAs/GaAs quantum dot materials, submitted (2014.Google Scholar
[2] Pitt, MP, et al, Philosophical Magazine, 93 (2013), p. 1080.Google Scholar
[3] Tsakoumis, NE, et al, Catalysis Today, 205 (2013), p. 86.Google Scholar
[4] The authors acknowledge funding from the Research Council of Norway.Google Scholar