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Use of Focused Ion Beam Milling for Preparation of Frozen-Hydrated Specimens for TEM Tomography

  • M Marko (a1), M Scheeff (a2), N Salmon (a2), C Hsieh (a1), M Rodriguez (a3), J Frank (a4) and C Mannella (a1)...

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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

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Use of Focused Ion Beam Milling for Preparation of Frozen-Hydrated Specimens for TEM Tomography

  • M Marko (a1), M Scheeff (a2), N Salmon (a2), C Hsieh (a1), M Rodriguez (a3), J Frank (a4) and C Mannella (a1)...

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