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Use of Focused Ion Beam as a Sample Preparation Tool for Cryo-Electron Tomography

Published online by Cambridge University Press:  01 August 2018

Samuel Záchej ,
Jana Havránková ,
Kristýna Rosíková ,
Rostislav Váńa  and
Miloslav Havelka
Samuel Záchej
Affiliation:
TESCAN Brno, Brno, Czech Republic
Jana Havránková
Affiliation:
TESCAN ORSAY HOLDING, Brno, Czech Republic
Kristýna Rosíková
Affiliation:
TESCAN ORSAY HOLDING, Brno, Czech Republic
Rostislav Váńa
Affiliation:
TESCAN Brno, Brno, Czech Republic
Miloslav Havelka
Affiliation:
TESCAN Brno, Brno, Czech Republic

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 884 - 885
Copyright
© Microscopy Society of America 2018 

References

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[2] Al-Amoudi, A, Studer, D. Dubochet, J. Journal of Structural Biology Vol. 150 2005) p. 109–121.Google Scholar
[3] Hayles, M.F, et al, Journal of Microscopy Vol. 226 2007 263–269.Google Scholar