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Understanding Deformation and Failure Mechanisms via Multimodal and Multiscale Electron Diffraction Analysis

Published online by Cambridge University Press:  05 August 2019

Josh Kacher  and
Yung Suk Jeremy Yoo
Josh Kacher*
Affiliation:
Georgia Institute of Technology, School of Materials Science and Engineering, Atlanta, USA.
Yung Suk Jeremy Yoo
Affiliation:
Georgia Institute of Technology, School of Materials Science and Engineering, Atlanta, USA.
*
*Corresponding author: josh.kacher@mse.gatech.edu

Abstract

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Type
Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1950 - 1951
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Yoo, Y.S.J. et al. , Materials Science and Engineering: A. 724 (2018), p. 444-451.Google Scholar
[2]Gammer, C. et al. , Applied Physics Letters 109(8) (2016), p. 081906.Google Scholar
[3]This work was supported in part by the Laboratory Directed Research and Development program at Sandia National Laboratories, a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-AC04-94AL85000.Google Scholar