Hostname: page-component-76fb5796d-9pm4c Total loading time: 0 Render date: 2024-04-26T06:45:27.474Z Has data issue: false hasContentIssue false
  • English
  • Français

Uncovering the Microstructure of BaSnCb Thin Films Deposited on Different Substrates Using TEM

Published online by Cambridge University Press:  01 August 2018

Hwanhui Yun ,
Koustav Ganguly ,
William Postiglione ,
Bharat Jalan ,
Chris Leighton ,
K. Andre Mkhoyan  and
Jong Seok Jeong
Hwanhui Yun
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.
Koustav Ganguly
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.
William Postiglione
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.
Bharat Jalan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.
Chris Leighton
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.
K. Andre Mkhoyan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.
Jong Seok Jeong
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2198 - 2199
Copyright
© Microscopy Society of America 2018 

References

[1] Kim, H. J., et al, Appl. Phys. Express 5 2012) p. 061102.Google Scholar
[2] Kim, H. J., et al, Phys. Rev. B 86 2012) p. 165205.Google Scholar
[3] Luo, X., et al, Appl. Phys. Lett. 100 2012) p.p. 172112.Google Scholar
[4] Prakash, A., et al, Nat. Comm. 8 2017) p. 15167.Google Scholar
[5] Kim, U., et al, APL Mater. 2 2014) p. 056107.Google Scholar
[6] Ganguly, K., et al, APL Mater. 3 2015) p. 062509.Google Scholar
[7] Ganguly, K., et al, APL Materials 5 2017) p. 056102.Google Scholar
[8] This work was supported partially by the NSF MRSEC under Award Number DMR-1420013, Grant-in-Aid program of the University of Minnesota, and a fellowship from the Samsung Scholarship Foundation, Republic of Korea.Google Scholar