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Uncovering Atomic and Nano-scale Deformations in Two-dimensional Lateral Heterojunctions

Published online by Cambridge University Press:  30 July 2020

Yimo Han ,
David Muller ,
Saien Xie ,
Jiwoong Park ,
Ming-Yang Li  and
Lain-Jong Li
Yimo Han
Affiliation:
Rice University, Houston, Texas, United States
David Muller
Affiliation:
Cornell University, Ithaca, New York, United States
Saien Xie
Affiliation:
University of Chicago, Ithaca, New York, United States
Jiwoong Park
Affiliation:
University of Chicago, Chicago, Illinois, United States
Ming-Yang Li
Affiliation:
King Abdullah University of Science and Technology, Thuwal, Al Bahah, Saudi Arabia
Lain-Jong Li
Affiliation:
The University of New South Wales, New South Wales, New South Wales, Australia

Abstract

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Type
New Frontiers in Electron Microscopy of Two-dimensional Materials
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1630 - 1631
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Copyright
Copyright © Microscopy Society of America 2020

References

Han, Y. et al. Nano Letters, 18 (2018), p. 3746–3751.10.1021/acs.nanolett.8b00952CrossRefGoogle Scholar
Tate, M. W. et al. , Microscopy and Microanalysis 22 (2016), p. 237–249.10.1017/S1431927615015664CrossRefGoogle Scholar
Han, Y. et al. Nature Materials 17 (2018), p. 129–133.10.1038/nmat5038CrossRefGoogle Scholar
Zhang, C. et al. Nature Nanotechnology 13 (2018), p. 152–158.10.1038/s41565-017-0022-xCrossRefGoogle Scholar
Xie, S. et al. Science 359 (2018), p. 1131–1136.10.1126/science.aao5360CrossRefGoogle Scholar
Funded by the Cornell Center for Materials Research, an NSF MRSEC (DMR-1719875).Google Scholar
Y.H. is supported by the Dean for Research Innovation Fund for New Ideas in the Natural Sciences from Princeton University.Google Scholar