No CrossRef data available.
Article contents
Ultrahigh Temperature In Situ TEM Based Small-scale Mechanical Characterization
Published online by Cambridge University Press: 22 July 2022
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Beyond Visualization with In Situ and Operando TEM
- Information
- Copyright
- Copyright © Microscopy Society of America 2022
References
Greer; J, J. R.. De Hosson, T. M., Progress in Materials Science 56 (2011), 654-724. https://doi.org/10.1016/j.pmatsci.2011.01.005CrossRefGoogle Scholar
Grosso, R. L., et al. , Nano Lett. 20 (2020), 1041-1046. 10.1021/acs.nanolett.9b04205CrossRefGoogle Scholar
Grosso, R. L., et al. , Acta Mater. 200 (2020), 1008-1021. 10.1016/j.actamat.2020.08.070CrossRefGoogle Scholar
Vikrant, K. S. N., et al. , Acta Mater. 199 (2020), 530-541. 10.1016/j.actamat.2020.08.069CrossRefGoogle Scholar
Coffman, D. K., et al. , Journal of the European Ceramic Society (2022). https://doi.org/10.1016/j.jeurceramsoc.2022.02.052Google Scholar
Costantini;, J.-M. F. Beuneu, physica status solidi c 4 (2007), 1258-1263. https://doi.org/10.1002/pssc.200673752CrossRefGoogle Scholar
SJD acknowledges support from the NSF Grant No. DMR 1922867. KH and EJL were supported by the DOE-BES under FWP 15013170. This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology & Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE's National Nuclear Security Administration under contract DE-NA-0003525. The views expressed in the article do not necessarily represent the views of the U.S. DOE or the United States Government.Google Scholar
You have
Access