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Ultra-High Energy Resolution EELS

Published online by Cambridge University Press:  04 August 2017

T.C. Lovejoy ,
N.J. Bacon ,
A.L. Bleloch ,
N. Dellby ,
M.V. Hoffman  and
O.L. Krivanek
T.C. Lovejoy
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
N.J. Bacon
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
A.L. Bleloch
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
N. Dellby
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
M.V. Hoffman
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
O.L. Krivanek
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA Department of Physics, Arizona State University, Tempe, AZ, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1552 - 1553
Copyright
© Microscopy Society of America 2017 

References

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[4] Lagos, MJ & Batson, PE Nature, accepted 2017.Google Scholar
[4] Krivanek, OL, et al in: Scanning Transmission Electron Microscopy, SJ, Pennycook & PD Nellist EdsSpringer 2010). p. 615.Google Scholar
[6] Krivanek, OL, et al, Phil. Trans. R. Soc. A367 2009). p. 3683.CrossRefGoogle Scholar