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Two Methods for Measuring Lamellae Thicknesses In situ for Improved FIB Specimen Preparation

Published online by Cambridge University Press:  05 August 2019

Alexander Rakowski
Affiliation:
Department of Chemistry, University of California Irvine, Irvine, CA, USA. School of Materials, University of Manchester, Manchester, UK.
Evan Tillotson
Affiliation:
School of Materials, University of Manchester, Manchester, UK.
Aidan Rooney*
Affiliation:
CEA Leti, Grenoble, France.
Sarah Haigh*
Affiliation:
School of Materials, University of Manchester, Manchester, UK.
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Abstract

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Type
Advances in Focused Ion Beam Instrumentation and Techniques
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Pennycook, SJ, Ultramicroscopy 180 (2017), p. 22.CrossRefGoogle Scholar
[2]de Jonge, N and Ross, FM, Nature nanotechnology 6 (2011), p. 695.CrossRefGoogle Scholar
[3]Hu, S et al. , Nature nanotechnology 13 (2018), p. 468.CrossRefGoogle Scholar
[4]Krivanek, OL et al. , Microscopy 62 (2013), p. 3.CrossRefGoogle Scholar
[5]van Mierlo, W et al. , Ultramicroscopy 147 (2014), p. 149.CrossRefGoogle Scholar
[6]Salzer, R et al. , Microscopy and Microanalysis 15 (2009), p. 340.CrossRefGoogle Scholar
[7]Hiscock, M et al. , Microscopy and Microanalysis 20 (2014), p. 342.CrossRefGoogle Scholar
[8]Hovington, P, Drouin, D and Gauvin, R, Scanning 19 (1997), p. 1.CrossRefGoogle Scholar
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