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Transmission Kikuchi Diffraction (TKD)via a horizontally positioned detector

Published online by Cambridge University Press:  23 September 2015

J.-J. Fundenberger ,
E. Bouzy ,
D. Goran ,
J. Guyon ,
A. Morawiec  and
H. Yuan
J.-J. Fundenberger
Affiliation:
Laboratoire d'Etude des Microstructures et de Mecanique des Materiaux (LEM3), UMR CNRS 7239,Universite de Lorraine, 57045 Metz, France Laboratory of Excellence on Design of Alloy Metals for low-MAss Structures (DAMAS), Universite de Lorraine,57045 Metz, France
E. Bouzy
Affiliation:
Laboratoire d'Etude des Microstructures et de Mecanique des Materiaux (LEM3), UMR CNRS 7239,Universite de Lorraine, 57045 Metz, France Laboratory of Excellence on Design of Alloy Metals for low-MAss Structures (DAMAS), Universite de Lorraine,57045 Metz, France
D. Goran
Affiliation:
Bruker Nano GmbH, Am Studio 2D,12489 Berlin, Germany
J. Guyon
Affiliation:
Laboratoire d'Etude des Microstructures et de Mecanique des Materiaux (LEM3), UMR CNRS 7239,Universite de Lorraine, 57045 Metz, France Laboratory of Excellence on Design of Alloy Metals for low-MAss Structures (DAMAS), Universite de Lorraine,57045 Metz, France
A. Morawiec
Affiliation:
Institute of Metallurgy and Materials Science, Polish Academy of Sciences, Reymonta 25, 30059 Krakow, Poland
H. Yuan
Affiliation:
Laboratoire d'Etude des Microstructures et de Mecanique des Materiaux (LEM3), UMR CNRS 7239,Universite de Lorraine, 57045 Metz, France Laboratory of Excellence on Design of Alloy Metals for low-MAss Structures (DAMAS), Universite de Lorraine,57045 Metz, France

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1101 - 1102
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Fundenberger, J.J., Morawiec, A., Bouzy, E. & Lecomte, J.S., Ultramicroscopy 96 (2003). p 127.CrossRefGoogle Scholar
[2] Rauch, E.F., Veron, M., Portillo, J., Bultreys, D., Maniette, Y. & Nicolopoulos, S., Microscopy and Analysis 22 (2008) S5–S8.Google Scholar
[3] Keller, R.R. & Geiss, R.H. Journal of Microscopy 245 (2012). p 245.CrossRefGoogle Scholar
[4] Trimby, P.W. Ultramicroscopy 120 (2012). p 16.CrossRefGoogle Scholar
[5] Funderberger, J.J., Bouzy, E., Goran, D., Guyon, J., Yuan, H. & Morawiec, A. submitted to Ultramicroscopy.Google Scholar