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Tracking Dopant Diffusion Pathways inside Bulk Materials

Published online by Cambridge University Press:  27 August 2014

Stephen J. Pennycook
Affiliation:
Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, USA
Ryo Ishikawa
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Andrew R. Lupini
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Scott D. Findlay
Affiliation:
School of Physics, Monash University, Victoria 3800, Australia
Rohan Mishra
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA Department of Physics and Astronomy, Vanderbilt University, Nashville, TN, USA
Sokrates T. Pantelides
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA Department of Physics and Astronomy, Vanderbilt University, Nashville, TN, USA
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Abstract

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Copyright © Microscopy Society of America 2014 

References

[1] Lee, J., et al., Nature Communications, 4, 1650 (2013).CrossRef
[2] Zhou, W., et al., Phys Rev Lett 109, 206803 (2012).CrossRef
[3] Pennycook, T., et al., Nano Lett 12, 3038 (2012).CrossRef
[4] LeBeau, J.M., et al., Nano Lett. 10, 4405 (2010).CrossRef
[5] Ishikawa, R., et al., Microsc. Microanal. 20, 99 (2014).CrossRef
[6] Hwang, J., et al., Phys Rev Lett 111, 266101 (2013).CrossRef
[7] Research sponsored by a JSPS postdoctoral fellowship for research abroad (RI), the Materials Sciences and Engineering Division, Office of Basic Energy Sciences, U.S. Department of Energy (SJP, RM, STP) and by the McMinn Endowment (STP) at Vanderbilt University. Computations were supported by the National Energy Research Scientific Computing Center.CrossRef
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