Hostname: page-component-8448b6f56d-c47g7 Total loading time: 0 Render date: 2024-04-25T00:30:11.676Z Has data issue: false hasContentIssue false
  • English
  • Français

Towards Low-dose and Fast 4-D Scanning Transmission Electron Microscopy: New Sampling and Reconstruction Approaches

Published online by Cambridge University Press:  22 July 2022

Amirafshar Moshtaghpour ,
Abner Velazco-Torrejon ,
Alex Robinson ,
Emanuela Liberti ,
Judy S. Kim ,
Nigel D. Browning  and
Angus I. Kirkland
Amirafshar Moshtaghpour*
Affiliation:
Rosalind Franklin Institute, Harwell Science & Innovation Campus, Didcot, OX11 0QS, U. K Mechanical, Materials, & Aerospace Engineering, University of Liverpool, Liverpool, L69 3GH, U.K
Abner Velazco-Torrejon*
Affiliation:
Rosalind Franklin Institute, Harwell Science & Innovation Campus, Didcot, OX11 0QS, U. K
Alex Robinson
Affiliation:
Mechanical, Materials, & Aerospace Engineering, University of Liverpool, Liverpool, L69 3GH, U.K
Emanuela Liberti
Affiliation:
Rosalind Franklin Institute, Harwell Science & Innovation Campus, Didcot, OX11 0QS, U. K Department of Materials, University of Oxford, Oxford, OX2 6NN, U. K
Judy S. Kim
Affiliation:
Rosalind Franklin Institute, Harwell Science & Innovation Campus, Didcot, OX11 0QS, U. K Department of Materials, University of Oxford, Oxford, OX2 6NN, U. K
Nigel D. Browning
Affiliation:
Mechanical, Materials, & Aerospace Engineering, University of Liverpool, Liverpool, L69 3GH, U.K Physical & Computational Science, Pacific Northwest National Lab, Richland, WA 99352, USA Sivananthan Laboratories, 590 Territorial Drive, Bolingbrook, IL 60440, USA
Angus I. Kirkland
Affiliation:
Rosalind Franklin Institute, Harwell Science & Innovation Campus, Didcot, OX11 0QS, U. K Department of Materials, University of Oxford, Oxford, OX2 6NN, U. K
*
*Corresponding author: amirafshar.moshtaghpour@rfi.ac.uk. These authors contributed equally.
*Corresponding author: amirafshar.moshtaghpour@rfi.ac.uk. These authors contributed equally.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 372 - 373
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Rodenburg, J and Maiden, A in “Springer handbook of microscopy”, eds. Hawkes, PW and Spence, JCH (Springer International Publishing, Cham, Switzerland), pp. 819-904.Google Scholar
O'Leary, CM et al. , Applied Physics Letters, 116 (2020), p. 124101.CrossRefGoogle Scholar
Nicholls, D et al. , International Conference on Acoustics, Speech, and Signal Processing (2022).Google Scholar
Stevens, A et al. , Applied Physics Letters, 113 (2018), p. 033104.CrossRefGoogle Scholar
Donoho, DL, IEEE Transactions on Information. Theory, 52 (2006), pp. 1289-1306.CrossRefGoogle Scholar
Velazco, A et al. , Ultramicroscopy, 232 (2022), p. 113398.CrossRefGoogle Scholar
Lustig, M, IEEE Signal Processing Magazine, 25 (2008), pp. 72-82.CrossRefGoogle Scholar
Moshtaghpour, A et al. , SIAM Journal on Imaging Sciences, 12 (2019), pp. 671–715.Google Scholar
AM, AV, EL, JK, and AK are funded by the Rosalind Franklin Institute. AR and NB are funded by EPSRC.Google Scholar