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Toward Quantitative In Situ TEM of Materials and Devices in Gases and Liquids at the Atomic Scale

Published online by Cambridge University Press:  23 September 2015

Seiji Takeda ,
Hideto Yoshida  and
Kentaro Soma
Seiji Takeda
Affiliation:
Nanoscience and Nanotechnology Center, Institute of Scientific and Industrial Research (ISIR), Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
Hideto Yoshida
Affiliation:
Nanoscience and Nanotechnology Center, Institute of Scientific and Industrial Research (ISIR), Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
Kentaro Soma
Affiliation:
Nanoscience and Nanotechnology Center, Institute of Scientific and Industrial Research (ISIR), Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 729 - 730
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Kiritani, M. & Takata, H., J. Nucl. Mat., 69-70 (1978) 277.Google Scholar
[2] Flower, H. M., Tighe, N. J. & Swann, P. R. in High Voltage Electron Microscopy: Proceedings of the Third International Conference (eds. P.W. Swann, C. J. Humphreys & M. J. Goringe, (Academic Press, London, 1974.Google Scholar
[3] S. Takeda et al, Ultramicroscopy (2015) doi:10.1016/j.ultramic.2014.11.017 and references therein. [4] .Google Scholar
[4] For instance, P. A. Crozier and T. W. Hansen, MRS Bulletin 40 (2015), 38..CrossRefGoogle Scholar
[5] The authors acknowledge funding from Japan Society for the Promotion of Science Grant-in-Aid for Scientific Research (A) (No. 25246003) and Specially Promoted Research (No. 19001005)..Google Scholar