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Tomographic Characterization of Dislocations in Failure Regions of Broad Area InGaAs/AlGaAs Strained Layer Single Quantum Well High Power Laser Diodes

Published online by Cambridge University Press:  26 July 2009

B Foran ,
N Ives ,
T Yeoh ,
M Brodie ,
Y Sin ,
N Presser ,
M Mason  and
S Moss
B Foran
Affiliation:
The Aerospace Corporation
N Ives
Affiliation:
The Aerospace Corporation
T Yeoh
Affiliation:
The Aerospace Corporation
M Brodie
Affiliation:
The Aerospace Corporation
Y Sin
Affiliation:
The Aerospace Corporation
N Presser
Affiliation:
The Aerospace Corporation
M Mason
Affiliation:
The Aerospace Corporation
S Moss
Affiliation:
The Aerospace Corporation

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 598 - 599
Copyright
Copyright © Microscopy Society of America 2009