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A Tilting Procedure to Enhance Compositional Contrast and Reduce Residual Bragg Contrast in EFTEM Imaging of Planar Interfaces

Published online by Cambridge University Press:  02 July 2020

K.T. Moore ,
E.A. Stach ,
J.M. Howe ,
D.C. Elbert  and
D.R. Veblen
K.T. Moore
Affiliation:
Department of Earth and Planetary Sciences, Johns Hopkins University, Baltimore, MD21218U.S.A.
E.A. Stach
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Labs, Berkeley, CA94720U.S.A.
J.M. Howe
Affiliation:
Department of Material Science and Engineering, University of Virginia, Charlottesville, VA22903U.S.A.
D.C. Elbert
Affiliation:
Department of Earth and Planetary Sciences, Johns Hopkins University, Baltimore, MD21218U.S.A.
D.R. Veblen
Affiliation:
Department of Earth and Planetary Sciences, Johns Hopkins University, Baltimore, MD21218U.S.A.
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Extract

When acquiring energy-filtered TEM (EFTEM) images of a crystalline material, the detrimental effects of diffraction contrast can often be seen in raw energy-filtered images (EFI) (i.e., pre-edge and post-edge images), jump-ratio images and elemental maps as residual diffraction contrast. Residual diffraction contrast occurs in raw EFI because of plural scattering (i.e., inelastic-elastic and elastic-inelastic electron scattering) and in jump-ratio images and elemental maps because background removal procedures often are unable to completely account for intensity changes due to dynamical effects (elastic scattering) that occur between pre-edge and post-edge images acquired at different energy losses.

It is demonstrated in these experiments that, when examining a planar interface, EFTEM images have increased compositional contrast and decreased residual diffraction contrast when the sample is oriented so that the interface is parallel to the electron beam, but not directly on a zone axis.

Type
Electron Energy-Loss Spectroscopy (EELS) and Imaging
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 156 - 157
Copyright
Copyright © Microscopy Society of America

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References

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6. This work was supported by NSF grant EAR-9418090 to David R. Veblen and by NSF grant DMR-9630092 to James M. Howe.Google Scholar