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Three-Dimensional Point Defect Imaging by Large-angle Illumination STEM

  • Ryo Ishikawa (a1), Stephen J. Pennycook (a2), Andrew R. Lupini (a3), Scott D. Findlay (a4), Naoya Shibata (a1) (a5) and Yuichi Ikuhara (a1) (a5)...
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Abstract

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References

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[1] Sawada, H., et al, Microscopy 64 2015 213.
[2] Sawada, H., et al, J. Electron Microscopy 58 2009 341.
[3] Yang, Y., et al, Nature 542 2017 75.
[4] Ishikawa, R., et al, Ultramicroscopy 151 2015 122.
[5] Ishikawa, R., et al, Appl. Phys. Lett 109 2016 163102.
[6] A part of this work was supported by the Research & Development Initiative for Scientific Innovation of New Generation Batteries II (RISING II). A.R.L. was supported by the Office of Basic Energy Sciences, Materials Sciences and Engineering Division, U.S. Department of Energy.
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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