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Three-dimensional electric field mapping of an electrically biased atom probe needle using off-axis electron holography

  • Fengshan Zheng (a1), Vadim Migunov (a1) (a2), Jan Caron (a1), Hongchu Du (a1) (a2), Giulio Pozzi (a1) (a3) and Rafal E Dunin-Borkowski (a1)...
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References

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[1]Kelly, T.F., Larson, D.J., Annual Review of Materials Research. 42 (2012) 131.
[2]Kelly, T.F., Microscopy and Microanalysis. 23 (2017) 3445.
[3]Lichte, H., Lehmann, M., Reports on Progress in Physics. 71 (2008).
[4]Svensson, K., Jompol, Y., Olin, H., Olsson, E., Review of Scientific Instruments. 74 (2003) 4945.
[5]Matteucci, G., Missiroli, G.F., Muccini, M., Pozzi, G., Ultramicroscopy. 45 (1992) 7783.
[6]Caron, J., Ph.D. Thesis, RWTH Aachen University, 2017.
[7]The authors acknowledge the European Union for funding through the Marie Curie Initial Training Network Grant No. 606988 under FP7-PEOPLE-2013-ITN).

Three-dimensional electric field mapping of an electrically biased atom probe needle using off-axis electron holography

  • Fengshan Zheng (a1), Vadim Migunov (a1) (a2), Jan Caron (a1), Hongchu Du (a1) (a2), Giulio Pozzi (a1) (a3) and Rafal E Dunin-Borkowski (a1)...

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