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Three-Dimensional Characterization of Polycrystalline Materials by Combination of X-ray Diffraction and X-ray Imaging Techniques

Published online by Cambridge University Press:  26 July 2009

EM Lauridsen ,
W Ludwig ,
SO Poulsen ,
S Rolland du Roscoat ,
P Reischig ,
A King ,
A Lyckegaard  and
RW Fonda
EM Lauridsen
Affiliation:
Technical University of Denmark,Denmark
W Ludwig
Affiliation:
European Synchrotron Radiation Facility,France
SO Poulsen
Affiliation:
Technical University of Denmark,Denmark
S Rolland du Roscoat
Affiliation:
European Synchrotron Radiation Facility,France
P Reischig
Affiliation:
European Synchrotron Radiation Facility,France
A King
Affiliation:
School of Materials,University of Manchester,United Kingdom
A Lyckegaard
Affiliation:
Technical University of Denmark,Denmark
RW Fonda
Affiliation:
Naval Research Laboratory

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 616 - 617
Copyright
Copyright © Microscopy Society of America 2009