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Three Dimensional Characterization of Interfaces using Aberration-corrected STEM

Published online by Cambridge University Press:  01 August 2005

K van Benthem ,
A Y Borisevich ,
M F Chisholm ,
A R Lupini ,
S T Pantelides ,
S Rashkeev ,
M Varela  and
S J Pennycook
K van Benthem
Affiliation:
Oak Ridge National Laboratory
A Y Borisevich
Affiliation:
Oak Ridge National Laboratory
M F Chisholm
Affiliation:
Oak Ridge National Laboratory
A R Lupini
Affiliation:
Oak Ridge National Laboratory
S T Pantelides
Affiliation:
Oak Ridge National Laboratory
S Rashkeev
Affiliation:
Oak Ridge National Laboratory
M Varela
Affiliation:
Oak Ridge National Laboratory
S J Pennycook
Affiliation:
Oak Ridge National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1452 - 1453
Copyright
© 2005 Microscopy Society of America