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Thickness mapping of freestanding Ionic Liquid films using Electron Energy Loss Spectroscopy in the TEM

Published online by Cambridge University Press:  23 September 2015

A.E. Ribbe ,
P. Kim ,
D. Hoagland  and
T.P. Russell
A.E. Ribbe
Affiliation:
Department for Polymer Science & Engineering, University of Massachusetts Amherst, Amherst, Massachusetts 01003 USA
P. Kim
Affiliation:
Department for Polymer Science & Engineering, University of Massachusetts Amherst, Amherst, Massachusetts 01003 USA
D. Hoagland
Affiliation:
Department for Polymer Science & Engineering, University of Massachusetts Amherst, Amherst, Massachusetts 01003 USA
T.P. Russell
Affiliation:
Department for Polymer Science & Engineering, University of Massachusetts Amherst, Amherst, Massachusetts 01003 USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1555 - 1556
Copyright
Copyright © Microscopy Society of America 2015 

References

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