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TEM with in situ Ion Irradiation of Nuclear Materials: The IVEM-Tandem User Facility

Published online by Cambridge University Press:  23 September 2015

Meimei Li ,
Marquis A. Kirk ,
Peter M. Baldo  and
Edward A. Ryan
Meimei Li
Affiliation:
Nuclear Engineering Division, Argonne National Laboratory, Lemont, IL, USA
Marquis A. Kirk
Affiliation:
Nuclear Engineering Division, Argonne National Laboratory, Lemont, IL, USA
Peter M. Baldo
Affiliation:
Materials Science Division, Argonne National Laboratory, Lemont, IL, USA
Edward A. Ryan
Affiliation:
Nuclear Engineering Division, Argonne National Laboratory, Lemont, IL, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 437 - 438
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Li, Meimei, Eldrup, M., Byun, T. S., Hashimoto, N., Snead, L. L. & Zinkle, S. J. J. Nucl. Mater. 376 (2008) 11.Google Scholar
[2] Li, Meimei, Kirk, M.A., Baldo, P.M., Xu, Donghua & Wirth, B. D. Phil Mag. 92 (2012) 2048.Google Scholar
[3] Xu, D., Wirth, B. D., Li, M. & Kirk, M. Acta Mater. 60 (2012) 4286.Google Scholar
[4] The electron microscopy with in situ ion irradiation was accomplished at the Argonne National Laboratory at the IVEM-Tandem Facility, a user facility funded by the Department of Energy Office of Nuclear Energy, operated under Contract No. DE-AC02-06CH11357 by UChicago Argonne, LLC..Google Scholar