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TEM Characterization of Corrosion Initiation in Passive Films

Published online by Cambridge University Press:  02 July 2020

D. Elswick ,
J. Hren ,
P. Kotula ,
N. Missert  and
F. Wall
D. Elswick
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695
J. Hren
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695
P. Kotula
Affiliation:
Sandia National Laboratory, Albuquerque, NM
N. Missert
Affiliation:
Sandia National Laboratory, Albuquerque, NM
F. Wall
Affiliation:
Sandia National Laboratory, Albuquerque, NM
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Abstract

This research program is intended to develop new insight into the mechanisms of localized corrosion initiation in passive metals through unique approaches based on examining corrosion initiation on needle-shaped samples similar to field emitter tips. Samples with this geometry allow localization of corrosion initiation to the tip itself and therefore pit initiation can be confined to a small lateral area. Local electric fields can also be controlled, thus permitting damage to be confined in the passive over layer, and characterized before pit initiation.

High purity Al wire was used for the initial studies. Wire shaped specimens were electropolished in a 20 % perchloric in methyl alcohol solution at -30°C to obtain the fine needle geometry. The resultant tip radii ranged from 40 to 150 nm with no further sample prep needed and without the presence of artifacts.A custom-designed TEM holder for a Philips CM30 was fabricated, which allowed the needles to be characterized by TEM both prior to and after experiments.

Type
Oxidation/Corrosion
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 1278 - 1279
Copyright
Copyright © Microscopy Society of America 2001

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References

references

“Electronic Defects and Interface Potentials for Al Oxide Films on Al and Their Relationship to Electrochemical Properties”, Sullivan, J.P., Dunn, R.G., Barbour, J.C., Wall, F.D., Missert, N.A., Buchreit, R.G., The Electrochem. Soc. Proc. Series, Pennington, NJ (2000).Google Scholar
“The Effects of Chlorine Implantation on the Pitting Behavior of Aluminum”, Wall, F.D., Barbour, J.C., Sullivan, J.P., Missert, N.A., Bunker, B.C., Proc. 198 th Meeting of the Electrochemical Society, Phoenix, AZ (Oct., 2000)Google Scholar