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TEM Analysis of InGaAs/GaAs Quantum Well-Quantum Dot Structures for Optoelectronics Applications
Published online by Cambridge University Press: 25 July 2016
Abstract
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- Information
- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1256 - 1257
- Copyright
- © Microscopy Society of America 2016
References
References:
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35th IEEE Photovoltaic Specialists Conference (PVSC), (2010).Google Scholar
[6] This work was partially supported by the Russian Foundation for Basic Research under the grant №13-08-12159.Google Scholar