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Teaching Microscopy and Microscope Theory Based on Remote Instrument Access and Instrument Automation

Published online by Cambridge University Press:  02 July 2020

E. Voelkl ,
L.F. Allard ,
D. Tarnoff ,
D.B. Williams  and
L.A. Fama
E. Voelkl
Affiliation:
High Temperature Materials Laboratory, Oak Ridge National Laboratory, Oak Ridge, TN37831
L.F. Allard
Affiliation:
High Temperature Materials Laboratory, Oak Ridge National Laboratory, Oak Ridge, TN37831
D. Tarnoff
Affiliation:
Intermation, Inc., Gray, Tennessee37615-4271
D.B. Williams
Affiliation:
Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA18015
L.A. Fama
Affiliation:
Advanced Microscopy Techniques, Danvers, MA01923
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Extract

The intense use of computers to operate electron microscopes as well as the ability to control microscopes remotely over the Internet, is increasingly changing the way electron microscopes are being used and how microscopy is being taught. Practically all of the top-of-the-line electron microscopes offered by the microscope vendors today are fully computer controllable, and provide for digital imaging. The combination of both features with the ever increasing speed of computers has created a situation that has and will continue to change the way electron microscopists work.

Lehigh University together with Oak Ridge National Laboratory have collaborated since 1996 to make the instrumentation in the High Temperature Materials Laboratory at ORNL available for teaching purposes. The primary instrument being used is the Hitachi HF-2000 field emission TEM, which is controlled by Gatan's DigitalMicrograph™ (DM) software and uses a Ik by Ik CCD camera for digital imaging.

Type
Teaching Microscopy in the New Millennium
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 1162 - 1163
Copyright
Copyright © Microscopy Society of America

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References

References:

1.Voelkl, E., Allard, L.F., Bruley, J. and Williams, D.B., (Under)graduate teaching using Internet access, Proc. (1997) MSA, Springer, Vol. 3. Suppl. 2, 1095–1096.Google Scholar
2. Gatan, Inc. 5933 Coronado Lane, Pleasanton, CA 94588, USA.Google Scholar
3.Voelkl, E., Live Electron Holography: A Window To The Phase World, Proceedings of Microscopy and Microanalysis 1999, Vol. 5, Supplement 2, p950–951.CrossRefGoogle Scholar
4. Acknowledgements: Research sponsored by the High Temperature Materials Laboratory User Program, DOE Office of Transportation Technologies, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research Corporation.Google Scholar