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Synthesis and Microstructural Analysis of Si3N4 Nanorods

Published online by Cambridge University Press:  28 March 2002

Y.H. Gao ,
Y. Bando ,
K. Kurashima  and
T. Sato
Y.H. Gao
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
Y. Bando
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
K. Kurashima
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
T. Sato
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
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Abstract

α-Si3N4 nanorods with 20–80 nm width were synthesized by carbothermal reduction of SiO with amorphous activated carbon (AAC) as a reductant. Microstructural characterization of the synthesized nanorods was carried out by high resolution transmission electron microscopy (HRTEM) and energy dispersive X-ray analysis. Many Si3N4 nanorods were found to be twisted. Each twisted nanorod contained several straight Si3N4 parts. The straight parts had the rod axes orientated along the 〈1010〉 direction, which is the closest packing direction of α-Si3N4. There were two kinds of joints between the two adjacent straight Si3N4 parts. Formation mechanism of the Si3N4 nanorods is discussed.

Keywords

Si3N4 nanorodssynthesishigh resolution transmission electron microscopymicrostructureaxis orientationnucleationgrowth plane
Type
Research Article
Information
Microscopy and Microanalysis , Volume 8 , Issue 1 , February 2002 , pp. 5 - 10
Copyright
© 2002 Microscopy Society of America

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