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Synchrotron Radiation Analysis of 19th Century Daguerreotypes

Published online by Cambridge University Press:  10 August 2018

M. S. Kozachuk ,
T.K. Sham ,
I. Coulthard ,
R.R. Martin ,
A. J. Nelson  and
J. McElhone
M. S. Kozachuk
Affiliation:
The University of Western Ontario, Department of Chemistry, London, ON, Canada.
T.K. Sham
Affiliation:
The University of Western Ontario, Department of Chemistry, London, ON, Canada.
I. Coulthard*
Affiliation:
The Canadian Light Source, Saskatoon, SK, Canada.
R.R. Martin
Affiliation:
The University of Western Ontario, Department of Chemistry, London, ON, Canada.
A. J. Nelson
Affiliation:
The University of Western Ontario, Department of Chemistry, London, ON, Canada. The University of Western Ontario, Department of Anthropology, London, ON, Canada.
J. McElhone
Affiliation:
National Gallery of Canada, Musee des beaux-arts du Canada, Ottawa, ON, Canada.
*
* Corresponding author, ian.coulthard@lightsource.ca

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 532 - 535
Copyright
© Microscopy Society of America 2018 

References

[1] Ravines, P, Li, L McElroy, R J. Imaging Sci. Technol. 10 2016) p. 30504–30505.Google Scholar
[2] Arago, F Le daguerreotype comptes rendus des seances de l'academie des sciences 9 Bachelier Paris p. 250–267.Google Scholar
[3] Ravines, P, et al in Some science behind the daguerreotype: nanometer and sub-micrometer realities on and beneath the surface eds.P. Dillman, L. Bellot-Gurlet and I. Nenner Atlantis Press Paris p. 123–158.Google Scholar
[4] Kozachuk, MS, et al, Can. J. Chem. 95 2017) p. 1156–1162.Google Scholar
[5] Kozachuk, MS, et al, Int. J. Conserv. Sci. 8 2017) p. 675–684.Google Scholar
[6] Centeno, SA, et al, Appl. Phys. A 105 2011) p. 55–63.Google Scholar
[7] Barger, SM, Krishnaswamy, SV Messier, R J. Am. Conserv 22 1982) p. 13–24.CrossRefGoogle Scholar
[8] Barger, SM, Messier, R White, WB Photogr. Sci. Eng. 26 1982) p. 285–291.Google Scholar
[9] Ravines, P, Wiegandt, R Wichern, CM Surface Eng. 24 2008) p. 138–146.Google Scholar
[10] Ravines, P Am. Lab. 42 2010) p. 20–25.Google Scholar
[11] Anglos, D, et al, Appl Spectrosc. 56 2002) p. 423–432.CrossRefGoogle Scholar
[12] Hogan, DL, et al, Appl. Spectrosc. 53 1999) p. 1161–1168.Google Scholar
[13] Kozachuk, MS, et al, Herit. Sci 6 2018. doi: 10.1186/s40494-018-0171-8.Google Scholar
[14] Barger, SM, et al, Stud. Conserv. 31 1986) p. 15–28.Google Scholar
[15] Wei, W, et al, Topics Photogr. Preserv 14 2011) p. 24–40.Google Scholar
[16] The authors acknowledge funding from the National Science and Engineering Research Council of Canada, the Canadian Foundation for Innovation, Canada Research Chairs (TKS) and the Ontario Ministry of Innovation. Further support for interdisciplinary research was provided by The Dean's Office, Faculty of Science at The University of Western Ontario. This research was supported by the Synchrotron experiments were performed at the Canadian Light Source, which is supported by NSERC, NRC, CIHR and the University of Saskatchewan. The technical assistance of the Beamline Staff, Dr. Yongfeng Hu and Dr. Qunfeng Xiao is acknowledged.Google Scholar