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Subnanoscale characterization of lamellar interfaces in a complex TiAl Alloy

Published online by Cambridge University Press:  01 November 2002

S.S.A. Gerstl ,
Y.W. Kim  and
D.N. Seidman
S.S.A. Gerstl
Affiliation:
Materials Science and Engineering Department, Northwestern University, Evanston, IL 60208
Y.W. Kim
Affiliation:
Wright-Patterson Air Force Research Laboratory, Dayton, OH 45432
D.N. Seidman
Affiliation:
Materials Science and Engineering Department, Northwestern University, Evanston, IL 60208

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1096 - 1097
Copyright
Copyright © Microscopy Society of America 2002