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Sub-Nanometer-Resolution Magnetic Field Observation Using Aberration-Corrected 1.2-MV Holography Electron Microscope with Pulse Magnetization System

  • Toshiaki Tanigaki (a1), Tetsuya Akashi (a1), Akira Sugawara (a1), Katsuya Miura (a1), Jun Hayakawa (a1), Kodai Niitsu (a2), Takeshi Sato (a3), Xiuzhen Yu (a2), Yasuhide Tomioka (a4), Ken Harada (a2), Daisuke Shindo (a2) (a5), Yoshinori Tokura (a2) (a6) and Hiroyuki Shinada (a1)...
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      Sub-Nanometer-Resolution Magnetic Field Observation Using Aberration-Corrected 1.2-MV Holography Electron Microscope with Pulse Magnetization System
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References

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[1] Dunin-Borkowski, RE, et al, Microsc. Microanal 18(Suppl. 2 2012). p. 1708.
[2] Snoeck, E, et al, Microsc. Microanal 20(Suppl. 3 2014). p. 932.
[3] Tanigaki, T, et al, Adv. Imaging Electron Phys 198 2016). p. 69.
[4] Gatel, C, et al, Nano Lett 15 2015). p. 6952.
[5] Tanigaki, T, et al, Microsc. Microanal 22(Suppl. 3 2016). p. 1702.3.
[6] Part of this research was supported by a grant from the Japan Society for the Promotion of Science (JSPS) through the "Funding Program for World-Leading Innovative R&D on Science and Technology (FIRST Program)" initiated by the Council for Science, Technology, and Innovation (CSTI).

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