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Sub-Ångstrom and sub-eV resolution with the analytical SATEM

Published online by Cambridge University Press:  01 August 2004

G. Benner ,
M. Matijevic ,
A. Orchowski ,
P. Schlossmacher ,
A. Thesen ,
M. Haider  and
P. Hartel
G. Benner
Affiliation:
Carl Zeiss, Oberkochen, Germany
M. Matijevic
Affiliation:
Carl Zeiss, Oberkochen, Germany
A. Orchowski
Affiliation:
Carl Zeiss, Oberkochen, Germany
P. Schlossmacher
Affiliation:
Carl Zeiss, Oberkochen, Germany
A. Thesen
Affiliation:
Carl Zeiss, Oberkochen, Germany
M. Haider
Affiliation:
CEOS, Heidelberg, Germany
P. Hartel
Affiliation:
CEOS, Heidelberg, Germany
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Extract

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S03 , August 2004 , pp. 6 - 7
Copyright
© 2004 Microscopy Society of America

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